JPS58182200A - 記憶装置 - Google Patents

記憶装置

Info

Publication number
JPS58182200A
JPS58182200A JP57065677A JP6567782A JPS58182200A JP S58182200 A JPS58182200 A JP S58182200A JP 57065677 A JP57065677 A JP 57065677A JP 6567782 A JP6567782 A JP 6567782A JP S58182200 A JPS58182200 A JP S58182200A
Authority
JP
Japan
Prior art keywords
control circuit
signal
refresh
switching
scan
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57065677A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6349811B2 (enrdf_load_stackoverflow
Inventor
Shuichi Takanashi
高梨　秀一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP57065677A priority Critical patent/JPS58182200A/ja
Publication of JPS58182200A publication Critical patent/JPS58182200A/ja
Publication of JPS6349811B2 publication Critical patent/JPS6349811B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP57065677A 1982-04-20 1982-04-20 記憶装置 Granted JPS58182200A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57065677A JPS58182200A (ja) 1982-04-20 1982-04-20 記憶装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57065677A JPS58182200A (ja) 1982-04-20 1982-04-20 記憶装置

Publications (2)

Publication Number Publication Date
JPS58182200A true JPS58182200A (ja) 1983-10-25
JPS6349811B2 JPS6349811B2 (enrdf_load_stackoverflow) 1988-10-05

Family

ID=13293867

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57065677A Granted JPS58182200A (ja) 1982-04-20 1982-04-20 記憶装置

Country Status (1)

Country Link
JP (1) JPS58182200A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6446293A (en) * 1987-04-16 1989-02-20 Tandem Computers Inc Scanning tester for digital system with dynamic random access memory
JPH04288648A (ja) * 1990-07-03 1992-10-13 Digital Equip Corp <Dec> 診断走査によるメモリ装置のモード切り替え
JP2008089545A (ja) * 2006-10-05 2008-04-17 Matsushita Electric Ind Co Ltd 解析装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6446293A (en) * 1987-04-16 1989-02-20 Tandem Computers Inc Scanning tester for digital system with dynamic random access memory
JPH04288648A (ja) * 1990-07-03 1992-10-13 Digital Equip Corp <Dec> 診断走査によるメモリ装置のモード切り替え
JP2008089545A (ja) * 2006-10-05 2008-04-17 Matsushita Electric Ind Co Ltd 解析装置

Also Published As

Publication number Publication date
JPS6349811B2 (enrdf_load_stackoverflow) 1988-10-05

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