JPS58145233A - 診断用回路つき論理回路 - Google Patents

診断用回路つき論理回路

Info

Publication number
JPS58145233A
JPS58145233A JP57027424A JP2742482A JPS58145233A JP S58145233 A JPS58145233 A JP S58145233A JP 57027424 A JP57027424 A JP 57027424A JP 2742482 A JP2742482 A JP 2742482A JP S58145233 A JPS58145233 A JP S58145233A
Authority
JP
Japan
Prior art keywords
circuit
logic
signal
switch
lsi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57027424A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0432349B2 (enrdf_load_stackoverflow
Inventor
Takao Nishida
隆夫 西田
Shunsuke Miyamoto
宮本　俊介
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP57027424A priority Critical patent/JPS58145233A/ja
Publication of JPS58145233A publication Critical patent/JPS58145233A/ja
Publication of JPH0432349B2 publication Critical patent/JPH0432349B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Logic Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
JP57027424A 1982-02-24 1982-02-24 診断用回路つき論理回路 Granted JPS58145233A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57027424A JPS58145233A (ja) 1982-02-24 1982-02-24 診断用回路つき論理回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57027424A JPS58145233A (ja) 1982-02-24 1982-02-24 診断用回路つき論理回路

Publications (2)

Publication Number Publication Date
JPS58145233A true JPS58145233A (ja) 1983-08-30
JPH0432349B2 JPH0432349B2 (enrdf_load_stackoverflow) 1992-05-29

Family

ID=12220719

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57027424A Granted JPS58145233A (ja) 1982-02-24 1982-02-24 診断用回路つき論理回路

Country Status (1)

Country Link
JP (1) JPS58145233A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61262856A (ja) * 1985-05-16 1986-11-20 Nec Corp 試験回路
JPS63276135A (ja) * 1987-05-06 1988-11-14 Nec Corp 半導体集積回路
JPH01201176A (ja) * 1988-02-05 1989-08-14 Matsushita Electric Ind Co Ltd 論理回路のテスト方法
JPH05204748A (ja) * 1992-01-30 1993-08-13 Fujitsu Ltd マイクロプロセッサ
JP2008292400A (ja) * 2007-05-28 2008-12-04 Sharp Corp アナログコア及びディジタルコア混載ｌｓｉテスト回路

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5513818A (en) * 1978-07-14 1980-01-31 Hitachi Ltd Testing method
JPS573152A (en) * 1980-06-09 1982-01-08 Hitachi Ltd Information processing device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5513818A (en) * 1978-07-14 1980-01-31 Hitachi Ltd Testing method
JPS573152A (en) * 1980-06-09 1982-01-08 Hitachi Ltd Information processing device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61262856A (ja) * 1985-05-16 1986-11-20 Nec Corp 試験回路
JPS63276135A (ja) * 1987-05-06 1988-11-14 Nec Corp 半導体集積回路
JPH01201176A (ja) * 1988-02-05 1989-08-14 Matsushita Electric Ind Co Ltd 論理回路のテスト方法
JPH05204748A (ja) * 1992-01-30 1993-08-13 Fujitsu Ltd マイクロプロセッサ
JP2008292400A (ja) * 2007-05-28 2008-12-04 Sharp Corp アナログコア及びディジタルコア混載ｌｓｉテスト回路

Also Published As

Publication number Publication date
JPH0432349B2 (enrdf_load_stackoverflow) 1992-05-29

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