JPS5513818A - Testing method - Google Patents

Testing method

Info

Publication number
JPS5513818A
JPS5513818A JP8510178A JP8510178A JPS5513818A JP S5513818 A JPS5513818 A JP S5513818A JP 8510178 A JP8510178 A JP 8510178A JP 8510178 A JP8510178 A JP 8510178A JP S5513818 A JPS5513818 A JP S5513818A
Authority
JP
Japan
Prior art keywords
circuit part
substrate
main circuit
input
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8510178A
Other languages
Japanese (ja)
Inventor
Yuichi Oka
Yoshimitsu Takiguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8510178A priority Critical patent/JPS5513818A/en
Priority to US06/022,949 priority patent/US4286173A/en
Publication of JPS5513818A publication Critical patent/JPS5513818A/en
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To make it possible to test easily logic units arranged on a substrate by providing either an auxiliary path or auxiliary circuit part which allows signals to by-pass a main circuit part realizing a function at which logic units aim.
CONSTITUTION: On substrate 11, the logic circuit is composed of integrated-circuit chips IC1 to IC6, and IC1 to IC4 and IC6 have main circuit part 12 which realizes the function they aim at. Besides main circuit 12, IC5 has auxiliary path 13 and selector circuit 14 for the by-pass of the main circuit part and according to the logical value of input C1, either output of main circuit part 12 or auxiliary path 13 is selected by selector circuit part 14 and then outputted. A test input is applied to inputs a1, b1, d1 and e1 of substrate 11 and a selective input to input c1, so that the test can be exercised by making checks on outputs f1 to h1 of substrate 11.
COPYRIGHT: (C)1980,JPO&Japio
JP8510178A 1978-03-27 1978-07-14 Testing method Pending JPS5513818A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP8510178A JPS5513818A (en) 1978-07-14 1978-07-14 Testing method
US06/022,949 US4286173A (en) 1978-03-27 1979-03-22 Logical circuit having bypass circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8510178A JPS5513818A (en) 1978-07-14 1978-07-14 Testing method

Publications (1)

Publication Number Publication Date
JPS5513818A true JPS5513818A (en) 1980-01-31

Family

ID=13849213

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8510178A Pending JPS5513818A (en) 1978-03-27 1978-07-14 Testing method

Country Status (1)

Country Link
JP (1) JPS5513818A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58145233A (en) * 1982-02-24 1983-08-30 Hitachi Ltd Logical circuit provided with diagnosing circuit
JPS6042665A (en) * 1983-08-19 1985-03-06 Toshiba Corp Semiconductor integrated circuit device
JPS61116677A (en) * 1984-10-25 1986-06-04 Fujitsu Ltd Testing of circuit
JPS62102172A (en) * 1985-10-29 1987-05-12 Nec Corp Logical device
JPS63106288U (en) * 1986-12-25 1988-07-09
JPH02103482A (en) * 1988-10-13 1990-04-16 Matsushita Graphic Commun Syst Inc Integrated circuit device
JPH03272972A (en) * 1990-03-20 1991-12-04 Toyo Chem Co Ltd Winding device of linear material having modified cross-section

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58145233A (en) * 1982-02-24 1983-08-30 Hitachi Ltd Logical circuit provided with diagnosing circuit
JPH0432349B2 (en) * 1982-02-24 1992-05-29
JPS6042665A (en) * 1983-08-19 1985-03-06 Toshiba Corp Semiconductor integrated circuit device
JPS61116677A (en) * 1984-10-25 1986-06-04 Fujitsu Ltd Testing of circuit
JPS62102172A (en) * 1985-10-29 1987-05-12 Nec Corp Logical device
JPS63106288U (en) * 1986-12-25 1988-07-09
JPH02103482A (en) * 1988-10-13 1990-04-16 Matsushita Graphic Commun Syst Inc Integrated circuit device
JPH03272972A (en) * 1990-03-20 1991-12-04 Toyo Chem Co Ltd Winding device of linear material having modified cross-section

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