JPS5799726A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS5799726A
JPS5799726A JP17640580A JP17640580A JPS5799726A JP S5799726 A JPS5799726 A JP S5799726A JP 17640580 A JP17640580 A JP 17640580A JP 17640580 A JP17640580 A JP 17640580A JP S5799726 A JPS5799726 A JP S5799726A
Authority
JP
Japan
Prior art keywords
region
diffusion
faulty
type
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17640580A
Other languages
Japanese (ja)
Other versions
JPH0258767B2 (en
Inventor
Takayasu Kawamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Original Assignee
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meidensha Corp, Meidensha Electric Manufacturing Co Ltd filed Critical Meidensha Corp
Priority to JP17640580A priority Critical patent/JPS5799726A/en
Publication of JPS5799726A publication Critical patent/JPS5799726A/en
Publication of JPH0258767B2 publication Critical patent/JPH0258767B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007Multistep manufacturing processes
    • H01L29/66075Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66363Thyristors
    • H01L29/66371Thyristors structurally associated with another device, e.g. built-in diode
    • H01L29/66378Thyristors structurally associated with another device, e.g. built-in diode the other device being a controlling field-effect device

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Formation Of Insulating Films (AREA)
  • Junction Field-Effect Transistors (AREA)

Abstract

PURPOSE:To eliminate the production faulty elements due to abnormal diffusion by a method wherein after a faulty region developed during an epitaxial growth process on a surface of a substrate is covered with an oxide film, and with a phosphorus glass film formed during an N type impurity diffusion applied on this oxide film, an electrodes are fabricated. CONSTITUTION:For example on a manufacturing process of a GTO, after a P type region P2' is diffused on an N type substrate N1 and buried gate P3 is formed, a P type epitaxial layer P2'' is grown. After an SiO2 film is formed on this substrate, surfaces are for example optically inspected, a resist mask R is applied on a region Y where a faulty region F developed during an epitaxial growth and no N type diffusion layer is formed, and the SiO2 film is etched. Next after diffusion of phosphorus from a region where an SiO2 film is removed, an electrode is formed so that the SiO2 film on the faulty region F may be covered with a phosphorus glass layer PG formed during diffusion. By this method an abnormal diffusion through the faulty region F is prevented, and without reducing an effective area of the apparatus having a large area, degradation of characteristics can be eliminated.
JP17640580A 1980-12-13 1980-12-13 Manufacture of semiconductor device Granted JPS5799726A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17640580A JPS5799726A (en) 1980-12-13 1980-12-13 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17640580A JPS5799726A (en) 1980-12-13 1980-12-13 Manufacture of semiconductor device

Publications (2)

Publication Number Publication Date
JPS5799726A true JPS5799726A (en) 1982-06-21
JPH0258767B2 JPH0258767B2 (en) 1990-12-10

Family

ID=16013093

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17640580A Granted JPS5799726A (en) 1980-12-13 1980-12-13 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5799726A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53138292A (en) * 1977-05-06 1978-12-02 Bbc Brown Boveri & Cie Method of producing semiconductor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53138292A (en) * 1977-05-06 1978-12-02 Bbc Brown Boveri & Cie Method of producing semiconductor

Also Published As

Publication number Publication date
JPH0258767B2 (en) 1990-12-10

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