JPS5789222A - Flattening method of wafer - Google Patents
Flattening method of waferInfo
- Publication number
- JPS5789222A JPS5789222A JP16564080A JP16564080A JPS5789222A JP S5789222 A JPS5789222 A JP S5789222A JP 16564080 A JP16564080 A JP 16564080A JP 16564080 A JP16564080 A JP 16564080A JP S5789222 A JPS5789222 A JP S5789222A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- adhesive
- thickness
- exposed
- vacuum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
Abstract
PURPOSE:To flatten an exposed surface of a wafer with location varying in thickness and better drawing accuracy, by providing a specimen rack with an adhesive on the back, after vacuum-chucking a wafer surface on the flat reference surface. CONSTITUTION:An exposed surface of a wafer with location varying in thickness is pressed to the reference surface. The back of the wafer is mounted to a specimen rack with an adhesive, then the adhesive is dried and hardened. A method is provided to obtain the wafer with the flattened exposed surface after releasing the pressing. For instance, the surface (exposed) of a wafer 1 with location varying in thickness is vacuum-sucked by vacuum chuck 4. The wafer 1 surface is flattened by pressing on a base 5 surface with good flatness. With this condition remaining, the back of the wafer 1 is coated with an adhesive 2 thicker than location variation in thickness. After mounting to a specimen rack 3 with intense rigidity, drying, and hardening, the surface is kept flat.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16564080A JPS5789222A (en) | 1980-11-25 | 1980-11-25 | Flattening method of wafer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16564080A JPS5789222A (en) | 1980-11-25 | 1980-11-25 | Flattening method of wafer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5789222A true JPS5789222A (en) | 1982-06-03 |
Family
ID=15816197
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16564080A Pending JPS5789222A (en) | 1980-11-25 | 1980-11-25 | Flattening method of wafer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5789222A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0464311A (en) * | 1990-07-03 | 1992-02-28 | Kokuyo Co Ltd | Housing furniture |
-
1980
- 1980-11-25 JP JP16564080A patent/JPS5789222A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0464311A (en) * | 1990-07-03 | 1992-02-28 | Kokuyo Co Ltd | Housing furniture |
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