JPS577962A - Mos type semiconductor device - Google Patents
Mos type semiconductor deviceInfo
- Publication number
- JPS577962A JPS577962A JP8242280A JP8242280A JPS577962A JP S577962 A JPS577962 A JP S577962A JP 8242280 A JP8242280 A JP 8242280A JP 8242280 A JP8242280 A JP 8242280A JP S577962 A JPS577962 A JP S577962A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- electrodes
- impurity region
- electrode
- silicon substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title abstract 3
- 239000000758 substrate Substances 0.000 abstract 8
- 239000012535 impurity Substances 0.000 abstract 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 4
- 229910052710 silicon Inorganic materials 0.000 abstract 4
- 239000010703 silicon Substances 0.000 abstract 4
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/402—Field plates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7831—Field effect transistors with field effect produced by an insulated gate with multiple gate structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7838—Field effect transistors with field effect produced by an insulated gate without inversion channel, e.g. buried channel lateral MISFETs, normally-on lateral MISFETs, depletion-mode lateral MISFETs
Abstract
PURPOSE:To enable to sample hold an input signal in an MOS type semiconductor device with a small sample holding voltage by a method wherein a channel impurity region of inversely conductive type to a substrate is provided at the part of the semiconductor substrate facing to conductive electrodes. CONSTITUTION:The sample holding gate electrode 13 and the adjoining electrodes 14 for electrostatic shielding being piled up with the electrode 13 are provided on a silicon substrate 11 interposing an insulating film 12 between them. The electrodes 14 for electrostatic shielding are connected to an electric power source 15 to supply a DC bias voltage. An impurity region 16 for input of a signal and being inversely conductive to the substrate 11 is provided in high density at the part of the silicon substrate 11 adjoining to the electrode 14 for electrostatic shielding. Moreover an impurity region 17 for holding of a signal and being inversely conductive to the substrate 11 is provided in high density at the part of the silicon substrate 11 adjoining to the electrode 14 for electrostatic shielding being separated from the impurity region 16. Moreover the buried channel impurity layer 18 is provided at the part of the silicon substrate 11 facing to the electrodes 13,14.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8242280A JPS577962A (en) | 1980-06-18 | 1980-06-18 | Mos type semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8242280A JPS577962A (en) | 1980-06-18 | 1980-06-18 | Mos type semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS577962A true JPS577962A (en) | 1982-01-16 |
Family
ID=13774147
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8242280A Pending JPS577962A (en) | 1980-06-18 | 1980-06-18 | Mos type semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS577962A (en) |
-
1980
- 1980-06-18 JP JP8242280A patent/JPS577962A/en active Pending
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