JPS5753988A - Manufacture of thin film transistor - Google Patents

Manufacture of thin film transistor

Info

Publication number
JPS5753988A
JPS5753988A JP55128959A JP12895980A JPS5753988A JP S5753988 A JPS5753988 A JP S5753988A JP 55128959 A JP55128959 A JP 55128959A JP 12895980 A JP12895980 A JP 12895980A JP S5753988 A JPS5753988 A JP S5753988A
Authority
JP
Japan
Prior art keywords
cdte
cds
addition
layer
thin film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55128959A
Other languages
Japanese (ja)
Inventor
Koichi Sakurai
Tatsumi Ishiwatari
Koji Mori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP55128959A priority Critical patent/JPS5753988A/en
Publication of JPS5753988A publication Critical patent/JPS5753988A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/101Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/11Devices sensitive to infrared, visible or ultraviolet radiation characterised by two potential barriers, e.g. bipolar phototransistors
    • H01L31/1105Devices sensitive to infrared, visible or ultraviolet radiation characterised by two potential barriers, e.g. bipolar phototransistors the device being a bipolar phototransistor

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Light Receiving Elements (AREA)

Abstract

PURPOSE:To obtain a thin film device which can be formed into an arbitrary configuration easily by a method wherein an emitter layer of a CdS or a semiconductor containing a CdS is treated exclusively and selectively in 300-600 deg.C, a base layer of a CdTe or a semiconductor containing a CdTe is not treated by heating, and proper metal film of Al etc. is organized as a collector. CONSTITUTION:An In2O3 2 is applied on a quartz glass 1 by evaporation and keeping the glass 1 at 250-300 deg.C a CdS or a semiconductor 3 containing CdS for an emitter is piled up to be 1-5mum thick. By the treatment at 300-600 deg.C that follows a dark current is decreased a photo current is increased. Treatment in O2 is effective. Next a layer for a base which is built of CdTe or the one which is changed to be N type by addition of In into CdTe or by addition of excess Cd into CdTe and a layer 4 which is changed to be P type by addition of Li etc. or by excess addition of Te are piled to be approximately 1-3mum thick 4, one among Al, In, Ga, Cd and Te is attached 5 for a collector, and Au electrode 6 is attached. By this constitution the device is built easily into an arbitrary configuration and enlargement in area and length can be obtained.
JP55128959A 1980-09-17 1980-09-17 Manufacture of thin film transistor Pending JPS5753988A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55128959A JPS5753988A (en) 1980-09-17 1980-09-17 Manufacture of thin film transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55128959A JPS5753988A (en) 1980-09-17 1980-09-17 Manufacture of thin film transistor

Publications (1)

Publication Number Publication Date
JPS5753988A true JPS5753988A (en) 1982-03-31

Family

ID=14997636

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55128959A Pending JPS5753988A (en) 1980-09-17 1980-09-17 Manufacture of thin film transistor

Country Status (1)

Country Link
JP (1) JPS5753988A (en)

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