JPS5742170A - Field effect transistor - Google Patents

Field effect transistor

Info

Publication number
JPS5742170A
JPS5742170A JP11747780A JP11747780A JPS5742170A JP S5742170 A JPS5742170 A JP S5742170A JP 11747780 A JP11747780 A JP 11747780A JP 11747780 A JP11747780 A JP 11747780A JP S5742170 A JPS5742170 A JP S5742170A
Authority
JP
Japan
Prior art keywords
layer
layers
packaged
impurity concentration
band gap
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11747780A
Other languages
Japanese (ja)
Inventor
Kazunori Yamamoto
Masamichi Omori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP11747780A priority Critical patent/JPS5742170A/en
Publication of JPS5742170A publication Critical patent/JPS5742170A/en
Pending legal-status Critical Current

Links

Landscapes

  • Electrodes Of Semiconductors (AREA)
  • Junction Field-Effect Transistors (AREA)

Abstract

PURPOSE:To obtain an FET with a high speed responsiveness, a large current layers and a high S/N ratio by laminating a plurality of semiconductor layers so alternately in such a manner as to be vertical thereto that the impurity concentration and the energy band gap are varied between the two. CONSTITUTION:An n type semiconductor layer 2 is formed on a half-insulating substrate 1. Here, the layer 2 is made up of a lamination of several semiconductor layers 6 and 7 which are arranged alternately in close contact while vertical to the substrate 1. A hetero junction 8 is yielded between the layers 6 and 7. In this arrangement, the impurity concentration and the energy band gap of the layer 7 are both made larger than those of the layer 6. A gate electrode 5 comprising a metal conductive layer 14 is mounted at the center of the upper surface of these laminates at the right angle thereto. On end of the laminate is packaged with an n<+> type layer and a metal conductive layer 11 is provided at the top thereof to make a source electrode 3. Likewise, the other end thereof is packaged with an n<+> type layer 12 and a conductor layer 13 is placed thereon to make a drain electrode 4.
JP11747780A 1980-08-26 1980-08-26 Field effect transistor Pending JPS5742170A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11747780A JPS5742170A (en) 1980-08-26 1980-08-26 Field effect transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11747780A JPS5742170A (en) 1980-08-26 1980-08-26 Field effect transistor

Publications (1)

Publication Number Publication Date
JPS5742170A true JPS5742170A (en) 1982-03-09

Family

ID=14712657

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11747780A Pending JPS5742170A (en) 1980-08-26 1980-08-26 Field effect transistor

Country Status (1)

Country Link
JP (1) JPS5742170A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4795717A (en) * 1983-06-09 1989-01-03 Fujitsu Limited Method for producing semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4795717A (en) * 1983-06-09 1989-01-03 Fujitsu Limited Method for producing semiconductor device

Similar Documents

Publication Publication Date Title
JPS56169368A (en) High withstand voltage mos field effect semiconductor device
JPS56169369A (en) High withstand voltage mos field effect semiconductor device
JPS6484669A (en) Thin film transistor
JPS56162864A (en) Semiconductor device
JPS5742170A (en) Field effect transistor
JPS5662349A (en) Semiconductor device
JPS57102069A (en) Semiconductor device
JPS6467970A (en) Thin film transistor
JPS5615075A (en) Semiconductor device
JPS5339088A (en) Insulated gate type field effect semiconductor device
JPS53126875A (en) Gate protecting device
JPS5376771A (en) Insulated gate type field effect transistor
JPS56133876A (en) Manufacture of junction type field effect semiconductor device
JPS54121681A (en) Nis-type semiconductor device
JPS5522882A (en) Semiconductor device
JPS5745257A (en) Manufacture of semiconductor device
JPS56138946A (en) Semiconductor device
JPS5773979A (en) Field effect transistor
JPS56167342A (en) Semiconductor device
JPS5640277A (en) Semiconductor device
JPS5493980A (en) Field-effect semicoductor device
JPS575346A (en) Semiconductor device and manufacture thereof
JPS54154285A (en) Semiconductor device
JPS5789260A (en) Semiconductor logic circuit
TH13184A (en) A semiconductor device with an enhanced insulating gate-separated transistor.