JPS57211044A - Inspecting device - Google Patents

Inspecting device

Info

Publication number
JPS57211044A
JPS57211044A JP56095759A JP9575981A JPS57211044A JP S57211044 A JPS57211044 A JP S57211044A JP 56095759 A JP56095759 A JP 56095759A JP 9575981 A JP9575981 A JP 9575981A JP S57211044 A JPS57211044 A JP S57211044A
Authority
JP
Japan
Prior art keywords
image signal
frame
signal
inspection
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56095759A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0325740B2 (enExample
Inventor
Hajime Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hajime Industries Ltd
Original Assignee
Hajime Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hajime Industries Ltd filed Critical Hajime Industries Ltd
Priority to JP56095759A priority Critical patent/JPS57211044A/ja
Priority to US06/386,708 priority patent/US4486776A/en
Priority to AU84771/82A priority patent/AU548544B2/en
Priority to GB08217514A priority patent/GB2104214B/en
Priority to FR8210722A priority patent/FR2508170B1/fr
Priority to DE19823222904 priority patent/DE3222904A1/de
Priority to CA000405516A priority patent/CA1170333A/en
Publication of JPS57211044A publication Critical patent/JPS57211044A/ja
Publication of JPH0325740B2 publication Critical patent/JPH0325740B2/ja
Granted legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/04—Sorting according to size
    • B07C5/12—Sorting according to size characterised by the application to particular articles, not otherwise provided for
    • B07C5/122—Sorting according to size characterised by the application to particular articles, not otherwise provided for for bottles, ampoules, jars and other glassware
    • B07C5/126—Sorting according to size characterised by the application to particular articles, not otherwise provided for for bottles, ampoules, jars and other glassware by means of photo-electric sensors, e.g. according to colour
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16H—GEARING
    • F16H61/00—Control functions within control units of change-speed- or reversing-gearings for conveying rotary motion ; Control of exclusively fluid gearing, friction gearing, gearings with endless flexible members or other particular types of gearing
    • F16H61/14—Control of torque converter lock-up clutches
    • F16H61/143—Control of torque converter lock-up clutches using electric control means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07C—TIME OR ATTENDANCE REGISTERS; REGISTERING OR INDICATING THE WORKING OF MACHINES; GENERATING RANDOM NUMBERS; VOTING OR LOTTERY APPARATUS; ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDED FOR ELSEWHERE
    • G07C3/00—Registering or indicating the condition or the working of machines or other apparatus, other than vehicles
    • G07C3/14—Quality control systems
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16H—GEARING
    • F16H45/00—Combinations of fluid gearings for conveying rotary motion with couplings or clutches 
    • F16H45/02—Combinations of fluid gearings for conveying rotary motion with couplings or clutches  with mechanical clutches for bridging a fluid gearing of the hydrokinetic type
    • F16H2045/0273—Combinations of fluid gearings for conveying rotary motion with couplings or clutches  with mechanical clutches for bridging a fluid gearing of the hydrokinetic type characterised by the type of the friction surface of the lock-up clutch
    • F16H2045/0294—Single disk type lock-up clutch, i.e. using a single disc engaged between friction members

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Mechanical Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Quality & Reliability (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Closed-Circuit Television Systems (AREA)
JP56095759A 1981-06-19 1981-06-19 Inspecting device Granted JPS57211044A (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP56095759A JPS57211044A (en) 1981-06-19 1981-06-19 Inspecting device
US06/386,708 US4486776A (en) 1981-06-19 1982-06-09 Inspection apparatus
AU84771/82A AU548544B2 (en) 1981-06-19 1982-06-10 Video object inspection system
GB08217514A GB2104214B (en) 1981-06-19 1982-06-17 Inspection system
FR8210722A FR2508170B1 (fr) 1981-06-19 1982-06-18 Systeme de controle d'objets
DE19823222904 DE3222904A1 (de) 1981-06-19 1982-06-18 Vorrichtung zur pruefung von objekten
CA000405516A CA1170333A (en) 1981-06-19 1982-06-18 Inspection apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56095759A JPS57211044A (en) 1981-06-19 1981-06-19 Inspecting device

Publications (2)

Publication Number Publication Date
JPS57211044A true JPS57211044A (en) 1982-12-24
JPH0325740B2 JPH0325740B2 (enExample) 1991-04-08

Family

ID=14146407

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56095759A Granted JPS57211044A (en) 1981-06-19 1981-06-19 Inspecting device

Country Status (7)

Country Link
US (1) US4486776A (enExample)
JP (1) JPS57211044A (enExample)
AU (1) AU548544B2 (enExample)
CA (1) CA1170333A (enExample)
DE (1) DE3222904A1 (enExample)
FR (1) FR2508170B1 (enExample)
GB (1) GB2104214B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61133844A (ja) * 1984-12-03 1986-06-21 Shin Meiwa Ind Co Ltd 端子圧着電線の端子圧着部検査方法

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2544856B1 (fr) * 1983-04-25 1986-10-24 Oreal Procede de controle de l'epaisseur des parois de recipients en verre et dispositif correspondant
US4618938A (en) * 1984-02-22 1986-10-21 Kla Instruments Corporation Method and apparatus for automatic wafer inspection
US4586080A (en) * 1984-03-22 1986-04-29 Ball Corporation Method and apparatus for video inspection of articles of manufacture
US4877965A (en) * 1985-07-01 1989-10-31 Diatron Corporation Fluorometer
USRE34782E (en) * 1985-07-01 1994-11-08 Diatron Corporation Fluorometer
US4644394A (en) * 1985-12-31 1987-02-17 Dale Reeves Apparatus for inspecting an externally threaded surface of an object
FR2600154B1 (fr) * 1986-06-13 1991-09-06 Anred Procede de reconnaissance de forme d'objet a symetrie axiale, notamment bouteille, et dispositif de mise en oeuvre du procede
US4915237A (en) * 1986-09-11 1990-04-10 Inex/Vistech Technologies, Inc. Comprehensive container inspection system
DE3808744A1 (de) * 1987-07-16 1989-09-28 Agfa Gevaert Ag Pruefeinrichtung fuer magnetband-cassetten
US4882498A (en) * 1987-10-09 1989-11-21 Pressco, Inc. Pulsed-array video inspection lighting system
US4972093A (en) * 1987-10-09 1990-11-20 Pressco Inc. Inspection lighting system
US5072127A (en) * 1987-10-09 1991-12-10 Pressco, Inc. Engineered video inspecting lighting array
US5051825A (en) * 1989-04-07 1991-09-24 Pressco, Inc. Dual image video inspection apparatus
US5131754A (en) * 1989-09-21 1992-07-21 Kabushiki Kaisha Kobe Seiko Sho Method of and device for detecting position of body
DE4014661C2 (de) * 1990-05-08 1996-03-28 Groz & Soehne Theodor Optische Kontrolle von Stricknadeln an Strickautomaten
US5172005A (en) * 1991-02-20 1992-12-15 Pressco Technology, Inc. Engineered lighting system for tdi inspection comprising means for controlling lighting elements in accordance with specimen displacement
DE4202247A1 (de) * 1992-01-28 1993-07-29 Widmann Bildverarbeitungssyste Vorrichtung zum optischen pruefen von gegenstaenden
BR9406727A (pt) * 1993-05-28 1996-01-30 Axiom Bildverarbeit Syst Aparelho de inspeção automática para classificar artigo de acordo com caracteristica superficial de artigo aparelho de seleção automática aparelho de inspeção automática para categorizar peça de trabalho com base em seu padrão superficial e/ou de core/ou de textura processo para inspecionar artigo automaticamente para classificar o artigo de acordo com uma caracteristica superficical do mesmo
DE29518628U1 (de) * 1995-11-24 1997-04-10 Heuft Systemtechnik Gmbh, 56659 Burgbrohl Vorrichtung zum Drehen von rotationssymmetrischen Behältern wie Flaschen während des Transports unter Staudruck
JP3454400B2 (ja) * 1996-02-16 2003-10-06 三井金属鉱業株式会社 繰返しパターンの検査方法
ES2117575B1 (es) * 1996-08-05 1999-04-01 Chep Pooling Systems B V Procedimiento para el reconocimiento y la clasificacion automaticos de defectos en paletas o elementos similares, y sistema correspondiente .
US5774227A (en) * 1997-01-28 1998-06-30 The Whitaker Corporation Anomally detection machine for fabricated parts formed on a carrier strip and method of use
US6173213B1 (en) * 1998-05-11 2001-01-09 Ellison Machinery Company Motorized inbound laser orientation and wheel recognition station
US6894775B1 (en) 1999-04-29 2005-05-17 Pressco Technology Inc. System and method for inspecting the structural integrity of visibly clear objects
ATE384589T1 (de) * 1999-04-29 2008-02-15 Pressco Tech Inc Vorrichtung und verfahren zur untersuchung der strukturintegrität von durchsichtigen gegenständen
DE10244162A1 (de) * 2002-09-23 2004-04-01 Sick Ag Auslösen von Bildaufnahmen
US7525659B2 (en) * 2003-01-15 2009-04-28 Negevtech Ltd. System for detection of water defects
WO2005069233A1 (en) * 2004-01-16 2005-07-28 Tomra Systems Asa Method and device for observing features of an object
EP1766363A2 (en) * 2004-07-12 2007-03-28 Negevtech Ltd. Multi mode inspection method and apparatus
US20060012781A1 (en) * 2004-07-14 2006-01-19 Negevtech Ltd. Programmable spatial filter for wafer inspection
US7804993B2 (en) 2005-02-28 2010-09-28 Applied Materials South East Asia Pte. Ltd. Method and apparatus for detecting defects in wafers including alignment of the wafer images so as to induce the same smear in all images
US7813541B2 (en) 2005-02-28 2010-10-12 Applied Materials South East Asia Pte. Ltd. Method and apparatus for detecting defects in wafers
US8031931B2 (en) 2006-04-24 2011-10-04 Applied Materials South East Asia Pte. Ltd. Printed fourier filtering in optical inspection tools
US7719674B2 (en) 2006-11-28 2010-05-18 Applied Materials South East Asia Pte. Ltd. Image splitting in optical inspection systems
US7714998B2 (en) 2006-11-28 2010-05-11 Applied Materials South East Asia Pte. Ltd. Image splitting in optical inspection systems
IL211761B (en) * 2010-03-24 2019-06-30 Camtek Ltd Scanning during acceleration supports a test system element
CN104316873B (zh) * 2014-11-13 2017-07-28 云南电网公司电力科学研究院 一种断路器及机构状态四位一体识别系统
US10422755B2 (en) * 2016-12-07 2019-09-24 Applied Vision Corporation Identifying defects in transparent containers
TR201700580A2 (tr) * 2017-01-13 2018-07-23 Anadolu Ueniversitesi Artirilmiş gerçekli̇k tabanli bi̇r test düzeneği̇
DE102018107689A1 (de) * 2018-03-29 2019-10-02 Krones Ag Verfahren und Vorrichtung zum Inspizieren von Behältnissen
CN114582041B (zh) * 2022-05-07 2023-02-17 绿城科技产业服务集团有限公司 一种基于视频分析算法的园区巡更系统
CN120489962B (zh) * 2025-07-18 2025-10-03 泛太能源环境(浙江)有限公司 光伏隐裂检测方法、装置、设备及存储介质

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5129837Y2 (enExample) * 1971-10-29 1976-07-27
JPS52104284A (en) * 1976-02-27 1977-09-01 Sapporo Breweries Method of detecting defects of glass bottle etc*

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3877821A (en) * 1973-07-23 1975-04-15 Inex Inc Apparatus for detecting flaws using an array of photo sensitive devices
US4002823A (en) * 1974-11-01 1977-01-11 Ball Corporation Method and apparatus for video inspection of articles of manufacture
GB1540075A (en) * 1975-05-09 1979-02-07 Rolls Royce Apparatus and a method of determining the shape of a surface
US4242702A (en) * 1976-12-01 1980-12-30 Hitachi, Ltd. Apparatus for automatically checking external appearance of object
JPS5596405A (en) * 1979-01-19 1980-07-22 Hajime Sangyo Kk Inspection device for moving object
JPS5684088A (en) * 1979-12-12 1981-07-09 Stanley Electric Co Ltd Picture signal transmitting method
US4318081A (en) * 1979-12-19 1982-03-02 Hajime Industries Ltd. Object inspection system

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5129837Y2 (enExample) * 1971-10-29 1976-07-27
JPS52104284A (en) * 1976-02-27 1977-09-01 Sapporo Breweries Method of detecting defects of glass bottle etc*

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61133844A (ja) * 1984-12-03 1986-06-21 Shin Meiwa Ind Co Ltd 端子圧着電線の端子圧着部検査方法

Also Published As

Publication number Publication date
GB2104214A (en) 1983-03-02
FR2508170A1 (fr) 1982-12-24
US4486776A (en) 1984-12-04
AU548544B2 (en) 1985-12-19
FR2508170B1 (fr) 1985-06-21
CA1170333A (en) 1984-07-03
AU8477182A (en) 1982-12-23
DE3222904C2 (enExample) 1990-01-25
JPH0325740B2 (enExample) 1991-04-08
DE3222904A1 (de) 1983-01-05
GB2104214B (en) 1984-07-04

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