JPS57208404A - Configuration detecting method - Google Patents
Configuration detecting methodInfo
- Publication number
- JPS57208404A JPS57208404A JP9383881A JP9383881A JPS57208404A JP S57208404 A JPS57208404 A JP S57208404A JP 9383881 A JP9383881 A JP 9383881A JP 9383881 A JP9383881 A JP 9383881A JP S57208404 A JPS57208404 A JP S57208404A
- Authority
- JP
- Japan
- Prior art keywords
- line
- bright
- optical cutting
- scanning
- bright line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
Landscapes
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9383881A JPS57208404A (en) | 1981-06-19 | 1981-06-19 | Configuration detecting method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9383881A JPS57208404A (en) | 1981-06-19 | 1981-06-19 | Configuration detecting method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57208404A true JPS57208404A (en) | 1982-12-21 |
JPS6322241B2 JPS6322241B2 (ja) | 1988-05-11 |
Family
ID=14093526
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9383881A Granted JPS57208404A (en) | 1981-06-19 | 1981-06-19 | Configuration detecting method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57208404A (ja) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60256004A (ja) * | 1984-06-01 | 1985-12-17 | Matsushita Electric Works Ltd | チツプ部品のはんだ付検査方法 |
JPS61120006A (ja) * | 1984-11-16 | 1986-06-07 | Nippon Tsushin Gijutsu Kk | 計測ヘツドの信号検出方法 |
JPS61130808A (ja) * | 1984-11-30 | 1986-06-18 | Hitachi Ltd | 光切断線検出装置 |
WO2003093761A1 (fr) | 2002-04-30 | 2003-11-13 | Jfe Steel Corporation | Procede et instrument de mesure de la forme de coupe du manchon de verre d'un tube electrique soude |
JP2020180919A (ja) * | 2019-04-26 | 2020-11-05 | 株式会社キーエンス | 光学式変位計 |
WO2021079541A1 (ja) * | 2019-10-23 | 2021-04-29 | オムロン株式会社 | 外観検査装置及び、不良検査方法 |
-
1981
- 1981-06-19 JP JP9383881A patent/JPS57208404A/ja active Granted
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60256004A (ja) * | 1984-06-01 | 1985-12-17 | Matsushita Electric Works Ltd | チツプ部品のはんだ付検査方法 |
JPH0437923B2 (ja) * | 1984-06-01 | 1992-06-22 | Matsushita Electric Works Ltd | |
JPS61120006A (ja) * | 1984-11-16 | 1986-06-07 | Nippon Tsushin Gijutsu Kk | 計測ヘツドの信号検出方法 |
JPS61130808A (ja) * | 1984-11-30 | 1986-06-18 | Hitachi Ltd | 光切断線検出装置 |
JPH0554603B2 (ja) * | 1984-11-30 | 1993-08-13 | Hitachi Ltd | |
WO2003093761A1 (fr) | 2002-04-30 | 2003-11-13 | Jfe Steel Corporation | Procede et instrument de mesure de la forme de coupe du manchon de verre d'un tube electrique soude |
JP2020180919A (ja) * | 2019-04-26 | 2020-11-05 | 株式会社キーエンス | 光学式変位計 |
WO2021079541A1 (ja) * | 2019-10-23 | 2021-04-29 | オムロン株式会社 | 外観検査装置及び、不良検査方法 |
JP2021067537A (ja) * | 2019-10-23 | 2021-04-30 | オムロン株式会社 | 外観検査装置及び、不良検査方法 |
US11936985B2 (en) | 2019-10-23 | 2024-03-19 | Omron Corporation | Appearance inspection device and defect inspection method |
Also Published As
Publication number | Publication date |
---|---|
JPS6322241B2 (ja) | 1988-05-11 |
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