JPS577505A - Detecting method for excess and deficient turn-tightening of cap and device thereof - Google Patents
Detecting method for excess and deficient turn-tightening of cap and device thereofInfo
- Publication number
- JPS577505A JPS577505A JP8108780A JP8108780A JPS577505A JP S577505 A JPS577505 A JP S577505A JP 8108780 A JP8108780 A JP 8108780A JP 8108780 A JP8108780 A JP 8108780A JP S577505 A JPS577505 A JP S577505A
- Authority
- JP
- Japan
- Prior art keywords
- turn
- tightening
- light
- image
- cap
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Force Measurement Appropriate To Specific Purposes (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
PURPOSE:To enable the high-reliable detection of excess and deficient turn-tightening by means of a simple and inexpensive device, by a method wherein a turn-tightening part is irradiated with a light, and the number of light-receiving ranges, which are more than a set strength, is detected through the image-formation of a reflection light on an image sensor. CONSTITUTION:A turn-tightening part of a bin 1 with a cap, which forms the subject, is irradiated with a light from a light source 4, and a reflection light is image-formed on an image sensor 4, and a reflection light is image-formed on an image sensor 6 through a lens 5. If turn-tightening of a cap 3 is in a better condition, the reflection light is image-formed on one point as shown in a light ray 7. If the cap has hanging-down parts 15, 16 due to a poor turn-tightening, the reflection light shows 2 image-formation points or more as shown in light rays 8 and 9. With the bin 1 forwarded and rotated by means of a drive device, a pulse signal from an image sensor 6 is inputted to a decision circuit for good or bad turn-tightening condition, and the number of light-receiving ranges, which are more than a set strength, is found to decide the good or bad turn-tightening condition. This permits the high-reliable detection of excess and deficient turn-tightening by means of a simple and inexpensive device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8108780A JPS577505A (en) | 1980-06-16 | 1980-06-16 | Detecting method for excess and deficient turn-tightening of cap and device thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8108780A JPS577505A (en) | 1980-06-16 | 1980-06-16 | Detecting method for excess and deficient turn-tightening of cap and device thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS577505A true JPS577505A (en) | 1982-01-14 |
JPS6310763B2 JPS6310763B2 (en) | 1988-03-09 |
Family
ID=13736601
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8108780A Granted JPS577505A (en) | 1980-06-16 | 1980-06-16 | Detecting method for excess and deficient turn-tightening of cap and device thereof |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS577505A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5004347A (en) * | 1988-11-21 | 1991-04-02 | Heuft-Qualiplus B.V. | Method and an apparatus for inspecting the edge of a lid |
US6658457B2 (en) | 1999-03-19 | 2003-12-02 | Fujitsu Limited | Device and method for interconnecting distant networks through dynamically allocated bandwidth |
JP2006300711A (en) * | 2005-04-20 | 2006-11-02 | Omron Corp | Defect inspection method for metallic cap, regulation method for inspection thereof, and defect inspection method for metallic cap |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4965256U (en) * | 1972-09-16 | 1974-06-07 | ||
JPS5119581A (en) * | 1974-08-08 | 1976-02-16 | Mitsubishi Electric Corp | HYOMENKETSUKANKENSASOCHI |
JPS52167946U (en) * | 1976-06-14 | 1977-12-20 |
-
1980
- 1980-06-16 JP JP8108780A patent/JPS577505A/en active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4965256U (en) * | 1972-09-16 | 1974-06-07 | ||
JPS5119581A (en) * | 1974-08-08 | 1976-02-16 | Mitsubishi Electric Corp | HYOMENKETSUKANKENSASOCHI |
JPS52167946U (en) * | 1976-06-14 | 1977-12-20 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5004347A (en) * | 1988-11-21 | 1991-04-02 | Heuft-Qualiplus B.V. | Method and an apparatus for inspecting the edge of a lid |
US6658457B2 (en) | 1999-03-19 | 2003-12-02 | Fujitsu Limited | Device and method for interconnecting distant networks through dynamically allocated bandwidth |
JP2006300711A (en) * | 2005-04-20 | 2006-11-02 | Omron Corp | Defect inspection method for metallic cap, regulation method for inspection thereof, and defect inspection method for metallic cap |
Also Published As
Publication number | Publication date |
---|---|
JPS6310763B2 (en) | 1988-03-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
AU593030B2 (en) | A method relating to three dimensional measurement of objects | |
JPS5315131A (en) | Detecting method for sharpness of objective image | |
US4215939A (en) | Glue drop detector | |
JPS6465460A (en) | Space filter type speed measuring instrument | |
IE46096L (en) | Coin testing device | |
JPS55125439A (en) | Defect inspection device | |
JPS577505A (en) | Detecting method for excess and deficient turn-tightening of cap and device thereof | |
JPS57182112A (en) | Range detector | |
JPS564004A (en) | System for detecting minute defects of body | |
SU956063A1 (en) | Method and apparatus for ore separation | |
JPS564834A (en) | Photo detection control system by light pen | |
JPS62200206A (en) | Apparatus for detecting edge of transparent matter | |
JPS577547A (en) | Inspection of bottle | |
JPS56153307A (en) | Focusing detecting method | |
JPS5778266A (en) | Video information input deivce | |
SU146959A1 (en) | Direction Indicator | |
JPS56104312A (en) | Detector | |
SU1767478A2 (en) | Device for checking mobile object attitude relative to orienting line | |
JPS5778270A (en) | Video information input device | |
JPS5520454A (en) | Testing unit of light transmitting object dependent upon laser | |
JPS5759326A (en) | Method for detection of image-forming position and device thereof | |
SU683517A1 (en) | Device for determining particle size | |
JPS5722211A (en) | Focusing detecting system | |
JPS56125605A (en) | Method and apparatus for detection of shape of striplike body | |
JPS6466503A (en) | Surface displacement measuring apparatus |