JPS5520454A - Testing unit of light transmitting object dependent upon laser - Google Patents
Testing unit of light transmitting object dependent upon laserInfo
- Publication number
- JPS5520454A JPS5520454A JP9363778A JP9363778A JPS5520454A JP S5520454 A JPS5520454 A JP S5520454A JP 9363778 A JP9363778 A JP 9363778A JP 9363778 A JP9363778 A JP 9363778A JP S5520454 A JPS5520454 A JP S5520454A
- Authority
- JP
- Japan
- Prior art keywords
- tested object
- detector
- laser
- laser light
- signal processing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Abstract
PURPOSE:To detect all optical defects of a light transmitting object and simplify the testing unit by providing a signal processing circuit, which detects whether a tested object exists or not, and a signal processing circuit which discriminates optical defects of the tested object. CONSTITUTION:The laser light from laser unit 1 is irradiate to tested object 2 by scanner 6, and the laser light going straightly from irradiation position P in the optical axis direction is received by first detector 4 and is converted to electric signals. Then, the light biased slightly from the optical axis of the irradiation position P laser light of tested object 2 is received by detector 5 consisting of two detectors 5a and 5b and is converted to electric signals. Signals obtained from detector 4 are applied to signal processing circuit 12, and it is detected whether the laser light scans tested object 2 or not. Signals obtained from detector 5 are also applied to circuit 12, and optical defects of tested object 2 are detected when defect signals over a set allowable range are detected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9363778A JPS5520454A (en) | 1978-08-02 | 1978-08-02 | Testing unit of light transmitting object dependent upon laser |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9363778A JPS5520454A (en) | 1978-08-02 | 1978-08-02 | Testing unit of light transmitting object dependent upon laser |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5520454A true JPS5520454A (en) | 1980-02-13 |
Family
ID=14087850
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9363778A Pending JPS5520454A (en) | 1978-08-02 | 1978-08-02 | Testing unit of light transmitting object dependent upon laser |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5520454A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6027845A (en) * | 1983-07-25 | 1985-02-12 | Nippon Sheet Glass Co Ltd | Inspecting apparatus for laminated glass |
| JPS63234140A (en) * | 1987-03-23 | 1988-09-29 | Ishikawajima Harima Heavy Ind Co Ltd | Detecting method for adhesion defect part |
| JP2009008643A (en) * | 2007-06-27 | 2009-01-15 | Oputouea Kk | Optical scanning type plane inspecting apparatus |
-
1978
- 1978-08-02 JP JP9363778A patent/JPS5520454A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6027845A (en) * | 1983-07-25 | 1985-02-12 | Nippon Sheet Glass Co Ltd | Inspecting apparatus for laminated glass |
| JPS63234140A (en) * | 1987-03-23 | 1988-09-29 | Ishikawajima Harima Heavy Ind Co Ltd | Detecting method for adhesion defect part |
| JP2009008643A (en) * | 2007-06-27 | 2009-01-15 | Oputouea Kk | Optical scanning type plane inspecting apparatus |
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