JPS57133649A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS57133649A
JPS57133649A JP2072181A JP2072181A JPS57133649A JP S57133649 A JPS57133649 A JP S57133649A JP 2072181 A JP2072181 A JP 2072181A JP 2072181 A JP2072181 A JP 2072181A JP S57133649 A JPS57133649 A JP S57133649A
Authority
JP
Japan
Prior art keywords
film
crystal
insulating film
mustache
wiring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2072181A
Other languages
Japanese (ja)
Other versions
JPS6248897B2 (en
Inventor
Hideaki Itakura
Katsuhiro Hirata
Haruhiko Abe
Masahiro Yoneda
Kyusaku Nishioka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2072181A priority Critical patent/JPS57133649A/en
Publication of JPS57133649A publication Critical patent/JPS57133649A/en
Publication of JPS6248897B2 publication Critical patent/JPS6248897B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Electrodes Of Semiconductors (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Abstract

PURPOSE:To obtain a reliable connection between metals by a method wherein, in the manufacture of a semiconductor device having multilayer interconnected constitution, when the internal metals are connected with upper electrode wiring metal making use of a grown up mustache type crystal of lower electrode wiring metal, a metal accelerating the growth of said mustache type crystal is provided as a pad under the lower metal. CONSTITUTION:The first insulating film 2 is expanded on the substrate 1 whereon internal or surface processing has been performed and Ti.W film 13 is formed on the said insulating film 2 but the film 13 is entirely removed with the exception of the part for internal connection by means of photoengraving process and the like. Then, the first insulating film 2 is entirely covered with Al layer 3 to be the first layer wiring and the wiring pattern 4 is partially formed including the said film 13 by means of etching to be further entirely covered with the second insulating film 5. Later, a mustache type crystal 9 is grown up out of the Al pattern 4 on the film 13 by means of the heattreatment at 300-400 deg.C. At this time, the crystal growing speed is approximate 5 times faster than the speed in the case without the film 13 as a pad making the crystal 9 project above the surface of the said film 5. After performing said procedures, Al wiring 8 of the second layer is connected to said crystal 9.
JP2072181A 1981-02-12 1981-02-12 Manufacture of semiconductor device Granted JPS57133649A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2072181A JPS57133649A (en) 1981-02-12 1981-02-12 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2072181A JPS57133649A (en) 1981-02-12 1981-02-12 Manufacture of semiconductor device

Publications (2)

Publication Number Publication Date
JPS57133649A true JPS57133649A (en) 1982-08-18
JPS6248897B2 JPS6248897B2 (en) 1987-10-16

Family

ID=12035028

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2072181A Granted JPS57133649A (en) 1981-02-12 1981-02-12 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS57133649A (en)

Also Published As

Publication number Publication date
JPS6248897B2 (en) 1987-10-16

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