JPS5690500A - Semiconductor memory device - Google Patents

Semiconductor memory device

Info

Publication number
JPS5690500A
JPS5690500A JP16852179A JP16852179A JPS5690500A JP S5690500 A JPS5690500 A JP S5690500A JP 16852179 A JP16852179 A JP 16852179A JP 16852179 A JP16852179 A JP 16852179A JP S5690500 A JPS5690500 A JP S5690500A
Authority
JP
Japan
Prior art keywords
circuit
data
error
error correction
read
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16852179A
Other languages
Japanese (ja)
Inventor
Masayuki Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP16852179A priority Critical patent/JPS5690500A/en
Publication of JPS5690500A publication Critical patent/JPS5690500A/en
Pending legal-status Critical Current

Links

Landscapes

  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

PURPOSE: To reduce read-out time and make reliability higher by incorporating an error correction system so as to output correction data by performing decoding processing only when there are data in the read-out data.
CONSTITUTION: An error correction encoding circuit 6 and an error correction decoding circuit 7 are provided, besides a memory cell part 1, a sensing circuit 2, an address decoder 3, a data input circuit 4 and a data output circuit 5. The read-out data X1WX8 from the sensing circuit 2 are directly sent to the data output circuit 5; at the same time, the data X1X8 and the error correction codes Y1WY4 are sent to the error correction decoding circuit 7. In said circuit 7, error checking is performed and only when there is an error, an error detection signal D is outputted to an error detection signal line 8 and correction data X1'WX8' are formed and are sent to said circuit 5. All the constituting elements are integrated on the same semiconductor substrate.
COPYRIGHT: (C)1981,JPO&Japio
JP16852179A 1979-12-25 1979-12-25 Semiconductor memory device Pending JPS5690500A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16852179A JPS5690500A (en) 1979-12-25 1979-12-25 Semiconductor memory device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16852179A JPS5690500A (en) 1979-12-25 1979-12-25 Semiconductor memory device

Publications (1)

Publication Number Publication Date
JPS5690500A true JPS5690500A (en) 1981-07-22

Family

ID=15869560

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16852179A Pending JPS5690500A (en) 1979-12-25 1979-12-25 Semiconductor memory device

Country Status (1)

Country Link
JP (1) JPS5690500A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59201296A (en) * 1983-04-28 1984-11-14 Fujitsu Ltd Error correction checking system of memory provided with ecc
JPS61126696A (en) * 1984-11-22 1986-06-14 Toshiba Corp Semiconductor memory device
KR100801083B1 (en) 2006-12-28 2008-02-05 삼성전자주식회사 Cyclic redundancy check code generating circuit, semiconductor memory device and driving method thereof

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59201296A (en) * 1983-04-28 1984-11-14 Fujitsu Ltd Error correction checking system of memory provided with ecc
JPS6240742B2 (en) * 1983-04-28 1987-08-29 Fujitsu Ltd
JPS61126696A (en) * 1984-11-22 1986-06-14 Toshiba Corp Semiconductor memory device
KR100801083B1 (en) 2006-12-28 2008-02-05 삼성전자주식회사 Cyclic redundancy check code generating circuit, semiconductor memory device and driving method thereof
US8321777B2 (en) 2006-12-28 2012-11-27 Samsung Electronics Co., Ltd. Cyclic redundancy check code generating circuit, semiconductor memory device, and method of driving semiconductor memory device
US8966338B2 (en) 2006-12-28 2015-02-24 Samsung Electronics Co., Ltd. Cyclic redundancy check code generating circuit, semiconductor memory device, and method of driving semiconductor memory device

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