JPS5676530A - Exposure of resist - Google Patents
Exposure of resistInfo
- Publication number
- JPS5676530A JPS5676530A JP15341879A JP15341879A JPS5676530A JP S5676530 A JPS5676530 A JP S5676530A JP 15341879 A JP15341879 A JP 15341879A JP 15341879 A JP15341879 A JP 15341879A JP S5676530 A JPS5676530 A JP S5676530A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- electron beam
- region
- irradiated
- accuracy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
- G03F7/7045—Hybrid exposures, i.e. multiple exposures of the same area using different types of exposure apparatus, e.g. combining projection, proximity, direct write, interferometric, UV, x-ray or particle beam
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2022—Multi-step exposure, e.g. hybrid; backside exposure; blanket exposure, e.g. for image reversal; edge exposure, e.g. for edge bead removal; corrective exposure
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electron Beam Exposure (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15341879A JPS5676530A (en) | 1979-11-27 | 1979-11-27 | Exposure of resist |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15341879A JPS5676530A (en) | 1979-11-27 | 1979-11-27 | Exposure of resist |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5676530A true JPS5676530A (en) | 1981-06-24 |
JPS6150377B2 JPS6150377B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1986-11-04 |
Family
ID=15562059
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15341879A Granted JPS5676530A (en) | 1979-11-27 | 1979-11-27 | Exposure of resist |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5676530A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5710390U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1980-06-20 | 1982-01-19 | ||
JPS5766633A (en) * | 1980-10-13 | 1982-04-22 | Oki Electric Ind Co Ltd | Pattern formation of fine processing resist |
JPS5839015A (ja) * | 1981-09-01 | 1983-03-07 | Pioneer Electronic Corp | 半導体装置の製造方法 |
JPS59141230A (ja) * | 1983-02-02 | 1984-08-13 | Mitsubishi Electric Corp | パタ−ン形成方法 |
JPS6010624A (ja) * | 1983-06-29 | 1985-01-19 | Mitsubishi Electric Corp | パタ−ン形成方法 |
-
1979
- 1979-11-27 JP JP15341879A patent/JPS5676530A/ja active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5710390U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1980-06-20 | 1982-01-19 | ||
JPS5766633A (en) * | 1980-10-13 | 1982-04-22 | Oki Electric Ind Co Ltd | Pattern formation of fine processing resist |
JPS5839015A (ja) * | 1981-09-01 | 1983-03-07 | Pioneer Electronic Corp | 半導体装置の製造方法 |
JPS59141230A (ja) * | 1983-02-02 | 1984-08-13 | Mitsubishi Electric Corp | パタ−ン形成方法 |
JPS6010624A (ja) * | 1983-06-29 | 1985-01-19 | Mitsubishi Electric Corp | パタ−ン形成方法 |
Also Published As
Publication number | Publication date |
---|---|
JPS6150377B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1986-11-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE3486187D1 (de) | Verfahren und vorrichtung zur herstellung von schutzlackbildern. | |
MY100941A (en) | A process of forming a negative patern in a photoresist layer. | |
SE7610739L (sv) | Forfarande for framstellning av plantryckformar medelst laserstralar | |
JPS5692536A (en) | Pattern formation method | |
JPS5676530A (en) | Exposure of resist | |
JPS5630129A (en) | Manufacture of photomask | |
JPS57124436A (en) | Correction of pattern defect | |
JPS5347825A (en) | Photoresist exposure | |
JPS56114942A (en) | High energy beam sensitive resist material and its using method | |
JPS56137632A (en) | Pattern forming | |
JPS56140345A (en) | Formation of pattern | |
JPS5712522A (en) | Forming method of pattern | |
JPS5556629A (en) | Pattern forming method | |
JPS55134847A (en) | Manufacture of resist image | |
JPS5832420A (ja) | 電子ビ−ム描画方法 | |
JPS55160429A (en) | Method for electron beam exposure | |
JPS5616129A (en) | Pattern forming method | |
JPS55138232A (en) | Drawing device | |
JPS56140342A (en) | Image forming composition and formation of resist image | |
JPS5655943A (en) | Pattern forming method | |
JPS55165631A (en) | Manufacture of semiconductor device | |
JPS5632143A (en) | Manufacture of photomask | |
JPS55163841A (en) | Method for electron beam exposure | |
JPS5741637A (en) | Microstep tablet | |
JPS5727031A (en) | Formation of resist pattern |