JPS5676042A - Field effect transistor for ion sensor - Google Patents

Field effect transistor for ion sensor

Info

Publication number
JPS5676042A
JPS5676042A JP15387579A JP15387579A JPS5676042A JP S5676042 A JPS5676042 A JP S5676042A JP 15387579 A JP15387579 A JP 15387579A JP 15387579 A JP15387579 A JP 15387579A JP S5676042 A JPS5676042 A JP S5676042A
Authority
JP
Japan
Prior art keywords
film
substrate
sio
polysilicon layer
field effect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15387579A
Other languages
Japanese (ja)
Other versions
JPS6134617B2 (en
Inventor
Yoshitaka Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shindengen Electric Manufacturing Co Ltd
Original Assignee
Shindengen Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shindengen Electric Manufacturing Co Ltd filed Critical Shindengen Electric Manufacturing Co Ltd
Priority to JP15387579A priority Critical patent/JPS5676042A/en
Publication of JPS5676042A publication Critical patent/JPS5676042A/en
Publication of JPS6134617B2 publication Critical patent/JPS6134617B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)

Abstract

PURPOSE: To concentrate the a sensor parts to the point of a substrate and to improve the yield of products by a method wherein insulation between the sensor part and an electrolyte is performed by using a semiconductor insulating film and an intermediate wiring part is performed by using a polysilicon for which impurity is doped.
CONSTITUTION: A source area 2 and a drain area 5 are formed at the point part of a silicon substrate 1 by means of diffusion, and an SiO2 film is formed on the whole surface of the substrate 1. Next thereto, an SiO2 film on the required surface of both areas 2 and 5 is removed and thereafter, a polysilicon layer 9 of a stripe or band type is formed toward the rear end of the substrate 1. On this polysilicon layer 9, an SiO2 film is formed and further, an SiN film is formed. Next thereto, the SiN film and SiO2 film of the required part at the surface rear end of the substrate 1 are removed to expose the polysilicon layer and a source electrode S and a drain electrode D are formed, thus, the field effect transistor for ion sensor being constituted. With this, the substrate 1 can be made into a small size and an insulating processing at a wiring part is easily performed.
COPYRIGHT: (C)1981,JPO&Japio
JP15387579A 1979-11-28 1979-11-28 Field effect transistor for ion sensor Granted JPS5676042A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15387579A JPS5676042A (en) 1979-11-28 1979-11-28 Field effect transistor for ion sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15387579A JPS5676042A (en) 1979-11-28 1979-11-28 Field effect transistor for ion sensor

Publications (2)

Publication Number Publication Date
JPS5676042A true JPS5676042A (en) 1981-06-23
JPS6134617B2 JPS6134617B2 (en) 1986-08-08

Family

ID=15572014

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15387579A Granted JPS5676042A (en) 1979-11-28 1979-11-28 Field effect transistor for ion sensor

Country Status (1)

Country Link
JP (1) JPS5676042A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62102160U (en) * 1985-12-18 1987-06-29
CN102290349A (en) * 2010-06-21 2011-12-21 无锡华润上华半导体有限公司 Semiconductor structure and forming method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62102160U (en) * 1985-12-18 1987-06-29
CN102290349A (en) * 2010-06-21 2011-12-21 无锡华润上华半导体有限公司 Semiconductor structure and forming method thereof

Also Published As

Publication number Publication date
JPS6134617B2 (en) 1986-08-08

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