JPS56128558A - Double focusing mass spectrograph - Google Patents

Double focusing mass spectrograph

Info

Publication number
JPS56128558A
JPS56128558A JP3036780A JP3036780A JPS56128558A JP S56128558 A JPS56128558 A JP S56128558A JP 3036780 A JP3036780 A JP 3036780A JP 3036780 A JP3036780 A JP 3036780A JP S56128558 A JPS56128558 A JP S56128558A
Authority
JP
Japan
Prior art keywords
scanning
magnetic field
electric field
voltage
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3036780A
Other languages
Japanese (ja)
Inventor
Sadao Takahashi
Hiroshi Hirose
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP3036780A priority Critical patent/JPS56128558A/en
Publication of JPS56128558A publication Critical patent/JPS56128558A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

PURPOSE:To obtain an energy spectrum, by repeatedly scanning magnetic field intensity at high speed simultaneously with the scanning of electric field voltage at low speed and processing integral addition to a mass peak obtained at every scanning of the magnetic field intensity. CONSTITUTION:An ion extracted from an ion source 1 is separated in accordance with an energy different by scanning applied voltage to an electric field 2 from regular voltage Vs to a zero-direction at low speed. The ion continuously separated in the electric field 2, though nextly passes through a magnetic field 3 where a scanning of magnetic field intensity is repeatedly operated at high speed, is detected by a secondary electron multiplier 4. A detected signal of the secondary electron multiplier 4 is amplified in a detection amplifier 5 and processed integral addition in a central control unit 12. This integral addition work is performed in throughout the whole range of scanning voltage in the electric field 2 to obtain an energy spectrum. The necessity for providing an ion collector between the electric field 2 and the magnetic field 3 is eliminated.
JP3036780A 1980-03-12 1980-03-12 Double focusing mass spectrograph Pending JPS56128558A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3036780A JPS56128558A (en) 1980-03-12 1980-03-12 Double focusing mass spectrograph

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3036780A JPS56128558A (en) 1980-03-12 1980-03-12 Double focusing mass spectrograph

Publications (1)

Publication Number Publication Date
JPS56128558A true JPS56128558A (en) 1981-10-08

Family

ID=12301887

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3036780A Pending JPS56128558A (en) 1980-03-12 1980-03-12 Double focusing mass spectrograph

Country Status (1)

Country Link
JP (1) JPS56128558A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59137855A (en) * 1983-01-28 1984-08-08 Jeol Ltd Mass spectrograph
US10068761B2 (en) 2014-08-26 2018-09-04 Micromass Uk Limited Fast modulation with downstream homogenisation

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59137855A (en) * 1983-01-28 1984-08-08 Jeol Ltd Mass spectrograph
JPH0319947B2 (en) * 1983-01-28 1991-03-18 Nippon Electron Optics Lab
US10068761B2 (en) 2014-08-26 2018-09-04 Micromass Uk Limited Fast modulation with downstream homogenisation

Similar Documents

Publication Publication Date Title
GB1440727A (en) Double-focussing mass spectrometers
JPS56128558A (en) Double focusing mass spectrograph
JPS5780649A (en) Electron ray energy analyzer
JPH0334253A (en) Ion detector
GB1387173A (en) Energy analyzer of the coaxial cylindrical type
JPS6226757A (en) Inductive coupling plasma mass spectrograph
JPS55102230A (en) Automatic focusing device
JPS5727553A (en) Adjusting method for ion source of mass-spectrometer
JPS5689040A (en) Evacuated leak detector
JPS57107550A (en) Ion detector for mass spectrograph
GB1286669A (en) Mass spectrometer apparatus
JPS57115752A (en) Ion detector for mass spectrograph
JPS5910690Y2 (en) mass spectrometer
JPS5765660A (en) Ion beam device
JPS5580255A (en) Charged particle beam processing device
EP0066954A3 (en) Mass spectrometers
GB957117A (en) Improvements relating to mass spectrometers
JPS5494092A (en) Mass analyzer
JPS56147354A (en) Mass spectrograph
JPS5730254A (en) Complex surface analyzer
JPS5629182A (en) Detector for atomic beam
JPS56167249A (en) Ion analizer
JPS57109244A (en) Ion source
JPS5730256A (en) Ion scattering spectral analyzer
JPS5676154A (en) Automatic sensitivity controller for mass spectrometer