JPS5676154A - Automatic sensitivity controller for mass spectrometer - Google Patents

Automatic sensitivity controller for mass spectrometer

Info

Publication number
JPS5676154A
JPS5676154A JP15403079A JP15403079A JPS5676154A JP S5676154 A JPS5676154 A JP S5676154A JP 15403079 A JP15403079 A JP 15403079A JP 15403079 A JP15403079 A JP 15403079A JP S5676154 A JPS5676154 A JP S5676154A
Authority
JP
Japan
Prior art keywords
magnetic field
strength
ion flow
ion
control signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15403079A
Other languages
Japanese (ja)
Inventor
Kiyoshi Nakai
Kazuo Saito
Katsuo Ii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Chemical Co Ltd
Original Assignee
Sumitomo Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co Ltd filed Critical Sumitomo Chemical Co Ltd
Priority to JP15403079A priority Critical patent/JPS5676154A/en
Publication of JPS5676154A publication Critical patent/JPS5676154A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To perform the analysis correctly in short time by providing the output of hole element proportional to the field sweep current and the field strength to an automatic sensivility control signal circuit then controlling the gain of an ion flow detector by means of the output signal. CONSTITUTION:The ion flow from an ion source 1 will pass through an electric field 2 and subjected to directional convergence by an electric field 3 and supplied to an ion flow detector 4. The ion provided to the detector 4 is converted to an electron and recorded as a mass spectrum through an amplifier 5. A magnetic field strength signal obtained from a hole element 7 inserted in the magnetic field is provided to an automatic sensivility control signal circuit 8 to produce a control signal for a high voltage generating circuit 6 to increase the applied voltage continuously or in step in accordance with the strength of magnetic field. Consequently the gain of the ion flow detector 4 will increase in accordance with the strength of magnetic field or the number of mass.
JP15403079A 1979-11-27 1979-11-27 Automatic sensitivity controller for mass spectrometer Pending JPS5676154A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15403079A JPS5676154A (en) 1979-11-27 1979-11-27 Automatic sensitivity controller for mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15403079A JPS5676154A (en) 1979-11-27 1979-11-27 Automatic sensitivity controller for mass spectrometer

Publications (1)

Publication Number Publication Date
JPS5676154A true JPS5676154A (en) 1981-06-23

Family

ID=15575366

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15403079A Pending JPS5676154A (en) 1979-11-27 1979-11-27 Automatic sensitivity controller for mass spectrometer

Country Status (1)

Country Link
JP (1) JPS5676154A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61207962A (en) * 1985-03-12 1986-09-16 Jeol Ltd Mass calibrating method for mass spectrometer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61207962A (en) * 1985-03-12 1986-09-16 Jeol Ltd Mass calibrating method for mass spectrometer

Similar Documents

Publication Publication Date Title
GB1448322A (en) Dynamic mass spectrometers
JPS5676154A (en) Automatic sensitivity controller for mass spectrometer
GB1394100A (en) Multichannel mass spectrometer
US4099052A (en) Mass spectrometer beam monitor
US2541656A (en) Method and apparatus for analyzing substance by mass spectrometry
JPS5638761A (en) Setting of magnetic field in mass spectrometer
GB1149426A (en) Improvements relating to mass spectrometry
USRE31043E (en) Mass spectrometer beam monitor
JPS5757461A (en) Magnetic field setting method for mass spectrometer
JPS5638759A (en) Rapid measurement of mass spectrum
GB957084A (en) Improvements relating to mass spectrometers
JPS5546421A (en) Mass spectrometer
GB1232613A (en)
JPS56128558A (en) Double focusing mass spectrograph
GB1513126A (en) Signal translation circuits
Goby et al. Electronic system for high sensitivity and high stability mass spectrometry: Part II. Electronic set-up for an “on-line” mass spectrometer
US2676264A (en) Automatic control apparatus for mass spectrometers
US2613323A (en) Mass spectrometry
GB1012912A (en) Automatic scanning instrument for charged-particle spectrometer
JPS57111457A (en) Voltage measuring device using electron beam
JPS5589738A (en) Auger electron photometry unit
GB1286669A (en) Mass spectrometer apparatus
JPS5734473A (en) Measuring device for radiation
GB1088594A (en) Improvements in or relating to mass spectrometers
JPS5569950A (en) Control method of analytical magnet and its device