JPS5638761A - Setting of magnetic field in mass spectrometer - Google Patents

Setting of magnetic field in mass spectrometer

Info

Publication number
JPS5638761A
JPS5638761A JP11389379A JP11389379A JPS5638761A JP S5638761 A JPS5638761 A JP S5638761A JP 11389379 A JP11389379 A JP 11389379A JP 11389379 A JP11389379 A JP 11389379A JP S5638761 A JPS5638761 A JP S5638761A
Authority
JP
Japan
Prior art keywords
magnetic field
mass number
memory
peak center
setting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11389379A
Other languages
Japanese (ja)
Other versions
JPS5913148B2 (en
Inventor
Tetsuya Sukai
Hideo Sugano
Kenichi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP54113893A priority Critical patent/JPS5913148B2/en
Publication of JPS5638761A publication Critical patent/JPS5638761A/en
Publication of JPS5913148B2 publication Critical patent/JPS5913148B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers
    • H01J49/30Static spectrometers using magnetic analysers, e.g. Dempster spectrometer

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To compensate accurately the magnetic field intensity for peak center by introducing compensating quantity given as a function of the mass number. CONSTITUTION:A secondary ion generated in a sample 1 is accelerated with an accelerating electorde 2, and detected with an ion detector 10 through an electric field 3 and a magnetic field 4. Outputs of a magnetic field detecting circuit 6 and magnetic field value setting device 7 are compared with a magnetic field controller 8 comprising a comparator, and a magnetic field generating circuit 9 controls an exciting current to obtain magnetic fields of each step corresponding to the output. Because the magnetic field is controlled directly by signals which represent the magnetic field, a mechanism for conversion of magnetic field intensity to mass number is needless. An arithmetic processing unit 13 figures out a peak center magnetic field corresponding to the mass number referring to contents of a memory 17 when the mass number is input from an input unit 18 to the memory 16.
JP54113893A 1979-09-04 1979-09-04 How to set the magnetic field in a mass spectrometer Expired JPS5913148B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54113893A JPS5913148B2 (en) 1979-09-04 1979-09-04 How to set the magnetic field in a mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54113893A JPS5913148B2 (en) 1979-09-04 1979-09-04 How to set the magnetic field in a mass spectrometer

Publications (2)

Publication Number Publication Date
JPS5638761A true JPS5638761A (en) 1981-04-14
JPS5913148B2 JPS5913148B2 (en) 1984-03-28

Family

ID=14623770

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54113893A Expired JPS5913148B2 (en) 1979-09-04 1979-09-04 How to set the magnetic field in a mass spectrometer

Country Status (1)

Country Link
JP (1) JPS5913148B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58190754A (en) * 1982-04-30 1983-11-07 Shimadzu Corp Mass number display apparatus of mass spectrometer apparatus
JPS6179452U (en) * 1984-10-30 1986-05-27
JPH03151503A (en) * 1989-11-07 1991-06-27 Hitachi Ltd Turbine control device and turbine overspeed detector

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0335742U (en) * 1989-08-15 1991-04-08

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58190754A (en) * 1982-04-30 1983-11-07 Shimadzu Corp Mass number display apparatus of mass spectrometer apparatus
JPH0376413B2 (en) * 1982-04-30 1991-12-05 Shimadzu Corp
JPS6179452U (en) * 1984-10-30 1986-05-27
JPH0342619Y2 (en) * 1984-10-30 1991-09-06
JPH03151503A (en) * 1989-11-07 1991-06-27 Hitachi Ltd Turbine control device and turbine overspeed detector

Also Published As

Publication number Publication date
JPS5913148B2 (en) 1984-03-28

Similar Documents

Publication Publication Date Title
Purser et al. An attempt to detect stable N-ions from a sputter ion source and some implications of the results for the design of tandems for ultra-sensitive carbon analysis
GB1478094A (en) Mass spectrometer system having programmable sensitivity
JPS5638761A (en) Setting of magnetic field in mass spectrometer
US3244876A (en) Mass spectrometric apparatus having a detector comprising two hall effect devices connected in tandem
JPS54114173A (en) Electronic probe device
JPS54158990A (en) Mass spectrograph for detecting multiple ions
Lawson The dynamics of high current electron ring beams in a time varying magnetic field with axial symmetry
JPS5546421A (en) Mass spectrometer
JPS51111386A (en) Apparatus for radiation analysis
JPS5943374A (en) Gain detector of secondary electron multiplier
JPS5693339A (en) Function test device of integrated circuit
JPS5757461A (en) Magnetic field setting method for mass spectrometer
JPS5569950A (en) Control method of analytical magnet and its device
JPS5688250A (en) Mass spectrograph
JPS5638759A (en) Rapid measurement of mass spectrum
JPS5689040A (en) Evacuated leak detector
JPS5676154A (en) Automatic sensitivity controller for mass spectrometer
JPS573360A (en) Mass spectroscope
GB1286669A (en) Mass spectrometer apparatus
SU393661A1 (en) MAGNETRON MASS SPECTROMETER
JPS5463890A (en) Peak detector of ion intensity signals of chromatographic mass analyzer
JPS5647727A (en) Electric dynamometer
JPS5753053A (en) Measuring method resolution in mass spectroscope
Vanke et al. System of nonlinear equations for the numerical analysis of a TWT with transverse field
JPS5352185A (en) Measuring apparatus of ion electric current