JPS5753053A - Measuring method resolution in mass spectroscope - Google Patents

Measuring method resolution in mass spectroscope

Info

Publication number
JPS5753053A
JPS5753053A JP55128761A JP12876180A JPS5753053A JP S5753053 A JPS5753053 A JP S5753053A JP 55128761 A JP55128761 A JP 55128761A JP 12876180 A JP12876180 A JP 12876180A JP S5753053 A JPS5753053 A JP S5753053A
Authority
JP
Japan
Prior art keywords
sweep
resolution
deltav
peak
counter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55128761A
Other languages
Japanese (ja)
Other versions
JPS6019623B2 (en
Inventor
Toru Asada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP55128761A priority Critical patent/JPS6019623B2/en
Publication of JPS5753053A publication Critical patent/JPS5753053A/en
Publication of JPS6019623B2 publication Critical patent/JPS6019623B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To automate measurement of resolution without requiring any special sample by measuring the resolution only by means of the single peak for the arbitrary number of masses. CONSTITUTION:An ion 3 is scattered by the electric field E at an electrode 4 and the magnetic field H of a magnet 5. It is projected on a collector 6 and detected. For this purpose, the spectral signal obtained in parallel with a sweep 7 is sampled by an A/D converter 11 based on a clock signal 12 and selectively supplied to a peak hole circuit 14 or a comparator 15 through a switching device 13. The sample data N1 corresponding to the sweep is obtained by a counter 18 and the sample data N2 corresponding to the peak width which is contained in a spectral signal is obtained by a counter 19. Besides, V/DELTAV.N1/N2 is obtained from the sweep rate DELTAV/V which is assigned by a regulator 23.
JP55128761A 1980-09-17 1980-09-17 Resolution measurement method in mass spectrometer Expired JPS6019623B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55128761A JPS6019623B2 (en) 1980-09-17 1980-09-17 Resolution measurement method in mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55128761A JPS6019623B2 (en) 1980-09-17 1980-09-17 Resolution measurement method in mass spectrometer

Publications (2)

Publication Number Publication Date
JPS5753053A true JPS5753053A (en) 1982-03-29
JPS6019623B2 JPS6019623B2 (en) 1985-05-17

Family

ID=14992806

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55128761A Expired JPS6019623B2 (en) 1980-09-17 1980-09-17 Resolution measurement method in mass spectrometer

Country Status (1)

Country Link
JP (1) JPS6019623B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6484556A (en) * 1987-09-28 1989-03-29 Hitachi Ltd Mass analyzer
WO2000049640A1 (en) * 1999-02-18 2000-08-24 Japan Science And Technology Corporation Isotopomer mass spectrometer

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6484556A (en) * 1987-09-28 1989-03-29 Hitachi Ltd Mass analyzer
WO2000049640A1 (en) * 1999-02-18 2000-08-24 Japan Science And Technology Corporation Isotopomer mass spectrometer
US6596991B1 (en) 1999-02-18 2003-07-22 Hitachi, Ltd. Isotopomer mass spectrometer

Also Published As

Publication number Publication date
JPS6019623B2 (en) 1985-05-17

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