JPS5753053A - Measuring method resolution in mass spectroscope - Google Patents
Measuring method resolution in mass spectroscopeInfo
- Publication number
- JPS5753053A JPS5753053A JP55128761A JP12876180A JPS5753053A JP S5753053 A JPS5753053 A JP S5753053A JP 55128761 A JP55128761 A JP 55128761A JP 12876180 A JP12876180 A JP 12876180A JP S5753053 A JPS5753053 A JP S5753053A
- Authority
- JP
- Japan
- Prior art keywords
- sweep
- resolution
- deltav
- peak
- counter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
PURPOSE:To automate measurement of resolution without requiring any special sample by measuring the resolution only by means of the single peak for the arbitrary number of masses. CONSTITUTION:An ion 3 is scattered by the electric field E at an electrode 4 and the magnetic field H of a magnet 5. It is projected on a collector 6 and detected. For this purpose, the spectral signal obtained in parallel with a sweep 7 is sampled by an A/D converter 11 based on a clock signal 12 and selectively supplied to a peak hole circuit 14 or a comparator 15 through a switching device 13. The sample data N1 corresponding to the sweep is obtained by a counter 18 and the sample data N2 corresponding to the peak width which is contained in a spectral signal is obtained by a counter 19. Besides, V/DELTAV.N1/N2 is obtained from the sweep rate DELTAV/V which is assigned by a regulator 23.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55128761A JPS6019623B2 (en) | 1980-09-17 | 1980-09-17 | Resolution measurement method in mass spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55128761A JPS6019623B2 (en) | 1980-09-17 | 1980-09-17 | Resolution measurement method in mass spectrometer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5753053A true JPS5753053A (en) | 1982-03-29 |
JPS6019623B2 JPS6019623B2 (en) | 1985-05-17 |
Family
ID=14992806
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55128761A Expired JPS6019623B2 (en) | 1980-09-17 | 1980-09-17 | Resolution measurement method in mass spectrometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6019623B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6484556A (en) * | 1987-09-28 | 1989-03-29 | Hitachi Ltd | Mass analyzer |
WO2000049640A1 (en) * | 1999-02-18 | 2000-08-24 | Japan Science And Technology Corporation | Isotopomer mass spectrometer |
-
1980
- 1980-09-17 JP JP55128761A patent/JPS6019623B2/en not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6484556A (en) * | 1987-09-28 | 1989-03-29 | Hitachi Ltd | Mass analyzer |
WO2000049640A1 (en) * | 1999-02-18 | 2000-08-24 | Japan Science And Technology Corporation | Isotopomer mass spectrometer |
US6596991B1 (en) | 1999-02-18 | 2003-07-22 | Hitachi, Ltd. | Isotopomer mass spectrometer |
Also Published As
Publication number | Publication date |
---|---|
JPS6019623B2 (en) | 1985-05-17 |
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