JPS6484556A - Mass analyzer - Google Patents

Mass analyzer

Info

Publication number
JPS6484556A
JPS6484556A JP62240958A JP24095887A JPS6484556A JP S6484556 A JPS6484556 A JP S6484556A JP 62240958 A JP62240958 A JP 62240958A JP 24095887 A JP24095887 A JP 24095887A JP S6484556 A JPS6484556 A JP S6484556A
Authority
JP
Japan
Prior art keywords
peak
resolution
display
width
computer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62240958A
Other languages
Japanese (ja)
Inventor
Fumio Komuro
Fumitada Kayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Instruments Engineering Co Ltd
Hitachi Ltd
Original Assignee
Hitachi Instruments Engineering Co Ltd
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Instruments Engineering Co Ltd, Hitachi Ltd filed Critical Hitachi Instruments Engineering Co Ltd
Priority to JP62240958A priority Critical patent/JPS6484556A/en
Publication of JPS6484556A publication Critical patent/JPS6484556A/en
Pending legal-status Critical Current

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  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To make it possible to calculate resolution using only one optional peak and further indicate it by calculating the resolution using digital values of the width of a peak on a screen, the picture element number of a display and the width being swept. CONSTITUTION:A computer 5 displays the peak profile on a display 6 after converting the detected ion amount from analog to digital. Peak width d in the peak strength k.h equivalent to the k% of this peak height h is calculated by the peak judging routine of a computer according to the picture element number of the display. The computer 5 can calculate the resolution of this equipment by repeatedly calculating swept digital value V and peak width d indicated on the display 6. Further, at need, the resolution can be indicated on the screen same as the peak profile.
JP62240958A 1987-09-28 1987-09-28 Mass analyzer Pending JPS6484556A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62240958A JPS6484556A (en) 1987-09-28 1987-09-28 Mass analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62240958A JPS6484556A (en) 1987-09-28 1987-09-28 Mass analyzer

Publications (1)

Publication Number Publication Date
JPS6484556A true JPS6484556A (en) 1989-03-29

Family

ID=17067180

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62240958A Pending JPS6484556A (en) 1987-09-28 1987-09-28 Mass analyzer

Country Status (1)

Country Link
JP (1) JPS6484556A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000049640A1 (en) * 1999-02-18 2000-08-24 Japan Science And Technology Corporation Isotopomer mass spectrometer

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55112562A (en) * 1979-02-23 1980-08-30 Hitachi Ltd Mass spectrometer
JPS5753053A (en) * 1980-09-17 1982-03-29 Jeol Ltd Measuring method resolution in mass spectroscope
JPS60202352A (en) * 1984-03-28 1985-10-12 Hitachi Ltd Mass spectrometer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55112562A (en) * 1979-02-23 1980-08-30 Hitachi Ltd Mass spectrometer
JPS5753053A (en) * 1980-09-17 1982-03-29 Jeol Ltd Measuring method resolution in mass spectroscope
JPS60202352A (en) * 1984-03-28 1985-10-12 Hitachi Ltd Mass spectrometer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000049640A1 (en) * 1999-02-18 2000-08-24 Japan Science And Technology Corporation Isotopomer mass spectrometer
US6596991B1 (en) 1999-02-18 2003-07-22 Hitachi, Ltd. Isotopomer mass spectrometer

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