JPS54158990A - Mass spectrograph for detecting multiple ions - Google Patents

Mass spectrograph for detecting multiple ions

Info

Publication number
JPS54158990A
JPS54158990A JP6803678A JP6803678A JPS54158990A JP S54158990 A JPS54158990 A JP S54158990A JP 6803678 A JP6803678 A JP 6803678A JP 6803678 A JP6803678 A JP 6803678A JP S54158990 A JPS54158990 A JP S54158990A
Authority
JP
Japan
Prior art keywords
voltage
acceleration voltage
computer
acceleration
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6803678A
Other languages
Japanese (ja)
Inventor
Etsuo Yamauchi
Shinji Hara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP6803678A priority Critical patent/JPS54158990A/en
Publication of JPS54158990A publication Critical patent/JPS54158990A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To make possible setting of acceleration voltage through one sample injection by superposing a sweep signal on the acceleration voltage which accelerates the ionized sample and integrating the detection signals at each level of the acceleration voltage by way of a computer.
CONSTITUTION: The sample having been ionized in an ion source 1 is accelerated by the superposed voltage of the acceleration voltage from a reference power source 9 changing stepwise and the sweep voltage from a sweep circuit 12 through a changeover circuit 10 controlled by a computer 7 and is then detected in an ion collector 4 through a fixed intensity analyzing magnetic field 3. The detected values thereof are integrated in the computer 7 by way of an A-D converter 6 and the integrated value by each acceleration voltage is individually stored in a memory 8. From the integrated value corresponding to the distribution of the ions according to this acceleration voltage, the acceleration set voltage for concentrating the peaks of the ion beams in the collector 4 is set through one sample injection without making intricate adjustments, thus the mass spectrometric analysis may be performed readily, accurately and rapidly.
COPYRIGHT: (C)1979,JPO&Japio
JP6803678A 1978-06-06 1978-06-06 Mass spectrograph for detecting multiple ions Pending JPS54158990A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6803678A JPS54158990A (en) 1978-06-06 1978-06-06 Mass spectrograph for detecting multiple ions

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6803678A JPS54158990A (en) 1978-06-06 1978-06-06 Mass spectrograph for detecting multiple ions

Publications (1)

Publication Number Publication Date
JPS54158990A true JPS54158990A (en) 1979-12-15

Family

ID=13362160

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6803678A Pending JPS54158990A (en) 1978-06-06 1978-06-06 Mass spectrograph for detecting multiple ions

Country Status (1)

Country Link
JP (1) JPS54158990A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59104544A (en) * 1982-12-07 1984-06-16 Jeol Ltd Mass spectrometric analysis device
JPS59125056A (en) * 1982-12-30 1984-07-19 Shimadzu Corp Mass spectrograph for mass fragmentography

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59104544A (en) * 1982-12-07 1984-06-16 Jeol Ltd Mass spectrometric analysis device
JPS59125056A (en) * 1982-12-30 1984-07-19 Shimadzu Corp Mass spectrograph for mass fragmentography

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