JPS6443962A - Mass spectrometer - Google Patents

Mass spectrometer

Info

Publication number
JPS6443962A
JPS6443962A JP62200487A JP20048787A JPS6443962A JP S6443962 A JPS6443962 A JP S6443962A JP 62200487 A JP62200487 A JP 62200487A JP 20048787 A JP20048787 A JP 20048787A JP S6443962 A JPS6443962 A JP S6443962A
Authority
JP
Japan
Prior art keywords
qualitative
ion source
sample
ions
result
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62200487A
Other languages
Japanese (ja)
Other versions
JPH0795438B2 (en
Inventor
Konosuke Oishi
Seiichi Murayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP62200487A priority Critical patent/JPH0795438B2/en
Publication of JPS6443962A publication Critical patent/JPS6443962A/en
Publication of JPH0795438B2 publication Critical patent/JPH0795438B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To make it possible to distinguish the same mass number of ions and to carry out the qualitative and the quantitative analysis by using the result of the qualitative analysis by a spectrophotometer and the detected m/z (mass number/charged volume) value. CONSTITUTION:An ion source 7 consisting of radioactive plasma, a feeding device to feed the sample to the ion source, a spectrophotometer 11 to measure the luminous spectrum of the sample emitted from the ion source 7, a quality deciding device 12 to perform the qualitative analysis of components of the sample from the result of measurement, and a separating device 16 to separate the m/z of ions emitted from the ion source 7 to every ion group are provided. Furthermore, a quantitative value deciding device 19 to carry out the quantitative analysis of each component included in the sample depending on the qualitative result decided by the m/z value of ions emitted from the ion source detected by a detector 17 and the qualitative result decided by the quality deciding device 12 is furnished. In such a composition, the ions of the same mass number is distinguished, and the qualitative and the quantitative analysis can be carried out.
JP62200487A 1987-08-11 1987-08-11 Mass spectrometer Expired - Lifetime JPH0795438B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62200487A JPH0795438B2 (en) 1987-08-11 1987-08-11 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62200487A JPH0795438B2 (en) 1987-08-11 1987-08-11 Mass spectrometer

Publications (2)

Publication Number Publication Date
JPS6443962A true JPS6443962A (en) 1989-02-16
JPH0795438B2 JPH0795438B2 (en) 1995-10-11

Family

ID=16425132

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62200487A Expired - Lifetime JPH0795438B2 (en) 1987-08-11 1987-08-11 Mass spectrometer

Country Status (1)

Country Link
JP (1) JPH0795438B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996038856A1 (en) * 1995-05-29 1996-12-05 Hitachi, Ltd. Mass spectrometer using plasma ion source
JP2011053078A (en) * 2009-09-01 2011-03-17 Tokyo Institute Of Technology Method and device for detection using plasma
KR20180041252A (en) * 2015-02-09 2018-04-23 도레이 리서치 센터 인코포레이티드 Analysis method and analysis device provided with same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5228387A (en) * 1975-08-29 1977-03-03 Hitachi Ltd Composite analysis apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5228387A (en) * 1975-08-29 1977-03-03 Hitachi Ltd Composite analysis apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996038856A1 (en) * 1995-05-29 1996-12-05 Hitachi, Ltd. Mass spectrometer using plasma ion source
JP2011053078A (en) * 2009-09-01 2011-03-17 Tokyo Institute Of Technology Method and device for detection using plasma
KR20180041252A (en) * 2015-02-09 2018-04-23 도레이 리서치 센터 인코포레이티드 Analysis method and analysis device provided with same

Also Published As

Publication number Publication date
JPH0795438B2 (en) 1995-10-11

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