JPS6443962A - Mass spectrometer - Google Patents
Mass spectrometerInfo
- Publication number
- JPS6443962A JPS6443962A JP62200487A JP20048787A JPS6443962A JP S6443962 A JPS6443962 A JP S6443962A JP 62200487 A JP62200487 A JP 62200487A JP 20048787 A JP20048787 A JP 20048787A JP S6443962 A JPS6443962 A JP S6443962A
- Authority
- JP
- Japan
- Prior art keywords
- qualitative
- ion source
- sample
- ions
- result
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
PURPOSE:To make it possible to distinguish the same mass number of ions and to carry out the qualitative and the quantitative analysis by using the result of the qualitative analysis by a spectrophotometer and the detected m/z (mass number/charged volume) value. CONSTITUTION:An ion source 7 consisting of radioactive plasma, a feeding device to feed the sample to the ion source, a spectrophotometer 11 to measure the luminous spectrum of the sample emitted from the ion source 7, a quality deciding device 12 to perform the qualitative analysis of components of the sample from the result of measurement, and a separating device 16 to separate the m/z of ions emitted from the ion source 7 to every ion group are provided. Furthermore, a quantitative value deciding device 19 to carry out the quantitative analysis of each component included in the sample depending on the qualitative result decided by the m/z value of ions emitted from the ion source detected by a detector 17 and the qualitative result decided by the quality deciding device 12 is furnished. In such a composition, the ions of the same mass number is distinguished, and the qualitative and the quantitative analysis can be carried out.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62200487A JPH0795438B2 (en) | 1987-08-11 | 1987-08-11 | Mass spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62200487A JPH0795438B2 (en) | 1987-08-11 | 1987-08-11 | Mass spectrometer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6443962A true JPS6443962A (en) | 1989-02-16 |
JPH0795438B2 JPH0795438B2 (en) | 1995-10-11 |
Family
ID=16425132
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62200487A Expired - Lifetime JPH0795438B2 (en) | 1987-08-11 | 1987-08-11 | Mass spectrometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0795438B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1996038856A1 (en) * | 1995-05-29 | 1996-12-05 | Hitachi, Ltd. | Mass spectrometer using plasma ion source |
JP2011053078A (en) * | 2009-09-01 | 2011-03-17 | Tokyo Institute Of Technology | Method and device for detection using plasma |
KR20180041252A (en) * | 2015-02-09 | 2018-04-23 | 도레이 리서치 센터 인코포레이티드 | Analysis method and analysis device provided with same |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5228387A (en) * | 1975-08-29 | 1977-03-03 | Hitachi Ltd | Composite analysis apparatus |
-
1987
- 1987-08-11 JP JP62200487A patent/JPH0795438B2/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5228387A (en) * | 1975-08-29 | 1977-03-03 | Hitachi Ltd | Composite analysis apparatus |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1996038856A1 (en) * | 1995-05-29 | 1996-12-05 | Hitachi, Ltd. | Mass spectrometer using plasma ion source |
JP2011053078A (en) * | 2009-09-01 | 2011-03-17 | Tokyo Institute Of Technology | Method and device for detection using plasma |
KR20180041252A (en) * | 2015-02-09 | 2018-04-23 | 도레이 리서치 센터 인코포레이티드 | Analysis method and analysis device provided with same |
Also Published As
Publication number | Publication date |
---|---|
JPH0795438B2 (en) | 1995-10-11 |
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