JPS5442196A - Sample analyzing apparatus by charged particle beams - Google Patents
Sample analyzing apparatus by charged particle beamsInfo
- Publication number
- JPS5442196A JPS5442196A JP10904677A JP10904677A JPS5442196A JP S5442196 A JPS5442196 A JP S5442196A JP 10904677 A JP10904677 A JP 10904677A JP 10904677 A JP10904677 A JP 10904677A JP S5442196 A JPS5442196 A JP S5442196A
- Authority
- JP
- Japan
- Prior art keywords
- charged particle
- analyzing apparatus
- particle beams
- sample analyzing
- common use
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
PURPOSE:To simplify the constitution of the entire part of the apparatus by making common use of respective charged particle detectors for energy analyzing apparatus and mass spectrograph with one detector and also making common use of the outlet slit of the energy analysing apparatus and the inlet slit of the mass spectrograph with one.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10904677A JPS5442196A (en) | 1977-09-09 | 1977-09-09 | Sample analyzing apparatus by charged particle beams |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10904677A JPS5442196A (en) | 1977-09-09 | 1977-09-09 | Sample analyzing apparatus by charged particle beams |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5442196A true JPS5442196A (en) | 1979-04-03 |
JPS6212464B2 JPS6212464B2 (en) | 1987-03-18 |
Family
ID=14500226
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10904677A Granted JPS5442196A (en) | 1977-09-09 | 1977-09-09 | Sample analyzing apparatus by charged particle beams |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5442196A (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6245648U (en) * | 1985-09-09 | 1987-03-19 | ||
JPS63162269U (en) * | 1987-04-13 | 1988-10-24 |
-
1977
- 1977-09-09 JP JP10904677A patent/JPS5442196A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6212464B2 (en) | 1987-03-18 |
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