JPS5788355A - Apparatus for x-ray analysis - Google Patents

Apparatus for x-ray analysis

Info

Publication number
JPS5788355A
JPS5788355A JP55164463A JP16446380A JPS5788355A JP S5788355 A JPS5788355 A JP S5788355A JP 55164463 A JP55164463 A JP 55164463A JP 16446380 A JP16446380 A JP 16446380A JP S5788355 A JPS5788355 A JP S5788355A
Authority
JP
Japan
Prior art keywords
sample
slits
time
ray
honeycombed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55164463A
Other languages
Japanese (ja)
Other versions
JPH0322582B2 (en
Inventor
Teruji Hirai
Masao Kawai
Gen Date
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP55164463A priority Critical patent/JPS5788355A/en
Publication of JPS5788355A publication Critical patent/JPS5788355A/en
Publication of JPH0322582B2 publication Critical patent/JPH0322582B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/316—Accessories, mechanical or electrical features collimators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/501—Detectors array

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To analyze the whole prescribed domain of a sample at the same time and in a short time, by making incident X-rays radiated from the sample to an X-ray detector arranged two-dimensionally through honeycombed slits. CONSTITUTION:10,000-piece section are arranged hundred by hundred rows in each length and breadth on honeycombed slits 3 so as to correspond to each section divided 100X100mm.<2> area of a sample 2 in 1X1mm.<2> square at 1 vs 1 and an X-ray detector group 4 is arranged in contact with the back of the slits 3. The sample 2 is irradiated by exciting X-rays from an X-ray tube 1 for about 4sec and fluorescence X-rays radiated from the sample 2 during that time are separated into their spectral components by the group of the detector 4 and level selectors l, l' and then, the detected output is integrated by capacitor groups C, C'. After the X-ray irradiation is finished, the charged voltage of the groups C, C' is inputted to a division circuits D successively. After A/D conversion of the division result is carried out, the converted value is compared with measured value of the element to be detected classified in percentage of content and the percentage of content is displayed. Hereby, the necessary time of analysis can be shortened sharply.
JP55164463A 1980-11-21 1980-11-21 Apparatus for x-ray analysis Granted JPS5788355A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55164463A JPS5788355A (en) 1980-11-21 1980-11-21 Apparatus for x-ray analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55164463A JPS5788355A (en) 1980-11-21 1980-11-21 Apparatus for x-ray analysis

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP1161229A Division JPH02132352A (en) 1989-06-23 1989-06-23 X-ray analyzer

Publications (2)

Publication Number Publication Date
JPS5788355A true JPS5788355A (en) 1982-06-02
JPH0322582B2 JPH0322582B2 (en) 1991-03-27

Family

ID=15793645

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55164463A Granted JPS5788355A (en) 1980-11-21 1980-11-21 Apparatus for x-ray analysis

Country Status (1)

Country Link
JP (1) JPS5788355A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4570698A (en) * 1983-09-21 1986-02-18 Asea Aktiebolag Method of and apparatus for centrifugal casting
JPH01147352A (en) * 1987-12-03 1989-06-09 Matsushita Electric Ind Co Ltd Method for evaluating element distribution degree

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50883A (en) * 1973-04-30 1975-01-07
JPS50118778A (en) * 1974-02-28 1975-09-17
JPS52141192A (en) * 1976-05-19 1977-11-25 Philips Nv Device for measuring radiation absorbing amount
JPS5328116A (en) * 1976-08-27 1978-03-16 Mitsubishi Chem Ind Ltd Preparation of glycine

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50883A (en) * 1973-04-30 1975-01-07
JPS50118778A (en) * 1974-02-28 1975-09-17
JPS52141192A (en) * 1976-05-19 1977-11-25 Philips Nv Device for measuring radiation absorbing amount
JPS5328116A (en) * 1976-08-27 1978-03-16 Mitsubishi Chem Ind Ltd Preparation of glycine

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4570698A (en) * 1983-09-21 1986-02-18 Asea Aktiebolag Method of and apparatus for centrifugal casting
JPH01147352A (en) * 1987-12-03 1989-06-09 Matsushita Electric Ind Co Ltd Method for evaluating element distribution degree

Also Published As

Publication number Publication date
JPH0322582B2 (en) 1991-03-27

Similar Documents

Publication Publication Date Title
CA1006989A (en) METHOD OF AND AN APPARATUS FOR EXAMINING A SAMPLE OR A MATERIAL BY MEASURING THE ABSORPTION OF .alpha.-RAY OR X-RAY RADIATION
JPS6457148A (en) Optically measuring apparatus
JPS5291483A (en) Multi-component analyzer
FR2362384A1 (en) AUTOMATIC SAMPLE SERIES MEASUREMENT DEVICE
JPS5788355A (en) Apparatus for x-ray analysis
JPS55156867A (en) Potential measuring device
Sanders et al. Neutron activation of sodium in anthropomorphous phantoms
SE8105326L (en) PROCEDURE AND DEVICE FOR ANALYZING OF ORE WITH USE OF GAMMA RADIATION
JPS57197454A (en) X-ray analysing apparatus
JPS57179732A (en) Apparatus for analysis of plating liquid
DE2440955A1 (en) METHOD AND DEVICE FOR INVESTIGATING THE SPATIAL DISTRIBUTION OF RADIOACTIVITY OF AN OBJECT
EP0400513A3 (en) Device for analysing mercury or hydride-generators by atomic absorption spectrometry
JPS52146688A (en) Fluorescent x ray analyzer
JPS52127292A (en) Analyzer
JPS545778A (en) Gas density analyzer
Milatz et al. A new photographic method for neutron velocity spectrography
TH811EX (en) Methods and machines for X-ray fluorescence spectroscopy
JPS551572A (en) X-ray measuring method of retained austenite quantity
JPS54159586A (en) Method and apparatus for measurement of reactivity of fuel assembly
JPS5326183A (en) X-ray analyzer
JPS57137843A (en) Measuring apparatus of luminescence life of sample
JPS5425776A (en) Field intensity detector
JPS57179731A (en) Method and apparatus for measuring concentration of element
DE2127994A1 (en) Gas analyser - with fluorescence source which improves selectivity, sensitivity and efficiency of appts
JPS6457157A (en) Simple quantitative analysis method with wavelength dispersion type x-ray spectroscope