JPS6457157A - Simple quantitative analysis method with wavelength dispersion type x-ray spectroscope - Google Patents
Simple quantitative analysis method with wavelength dispersion type x-ray spectroscopeInfo
- Publication number
- JPS6457157A JPS6457157A JP62213997A JP21399787A JPS6457157A JP S6457157 A JPS6457157 A JP S6457157A JP 62213997 A JP62213997 A JP 62213997A JP 21399787 A JP21399787 A JP 21399787A JP S6457157 A JPS6457157 A JP S6457157A
- Authority
- JP
- Japan
- Prior art keywords
- ray intensity
- sample
- measured
- intensity
- ray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
PURPOSE:To make it possible to shorten determining time to a large extent without analyzing a standard sample in quantitative analysis, by obtaining the relative intensity of X rays for every element from the X-ray intensity of the standard sample and the measured X-ray intensity of an unknown sample. CONSTITUTION:The characteristic X-ray intensities of various standard samples are measured. Namely, at first, the characteristic X-ray intensity of a reference sample, which is a reference sample for X-ray intensity comprising a stable element that is not directly related to an unknown sample, is measured. Then, the X-ray intensity of the standard sample of each element is measured. The ratio between this intensity and the X-ray intensity of the reference sample is obtained. Then, the X-ray intensity of an unknown sample is measured. Namely, at first, the measuring conditions are made the same as the conditions for the standard sample, and the X-ray intensity is measured with the reference sample. Then, the X-ray intensity is measured for each element of the unknown sample. The ratio between the X-ray intensity of the standard sample and the X-ray intensity of the reference sample, which is obtained beforehand, is multiplied by the measured X-ray intensity of the reference sample. Thus, the relative X-ray intensity of each element is obtained without the measurement of the standard sample for the relative X-ray intensity of each element of the standard sample. Correcting computation is performed on the basis of the obtained relative intensity, and the concentration of each element is obtained.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62213997A JPH0752163B2 (en) | 1987-08-27 | 1987-08-27 | Simplified quantitative analysis method using wavelength dispersive X-ray spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62213997A JPH0752163B2 (en) | 1987-08-27 | 1987-08-27 | Simplified quantitative analysis method using wavelength dispersive X-ray spectrometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6457157A true JPS6457157A (en) | 1989-03-03 |
| JPH0752163B2 JPH0752163B2 (en) | 1995-06-05 |
Family
ID=16648546
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62213997A Expired - Lifetime JPH0752163B2 (en) | 1987-08-27 | 1987-08-27 | Simplified quantitative analysis method using wavelength dispersive X-ray spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0752163B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0416754A (en) * | 1990-05-11 | 1992-01-21 | Shimadzu Corp | Analyzer |
| KR20040026868A (en) * | 2002-09-26 | 2004-04-01 | 현대자동차주식회사 | Method for Quantitative Analysis of ABS resin |
| JP2020024176A (en) * | 2018-08-08 | 2020-02-13 | 株式会社島津製作所 | Electron probe microanalyzer, data processing method and data processing program |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5040066A (en) * | 1973-08-15 | 1975-04-12 | ||
| JPS6070342A (en) * | 1983-09-28 | 1985-04-22 | Hitachi Ltd | X-ray microanalyzer |
| JPS6186640A (en) * | 1984-10-05 | 1986-05-02 | Kawasaki Steel Corp | Quantitative analysis method of concentration of element in x-ray analysis |
-
1987
- 1987-08-27 JP JP62213997A patent/JPH0752163B2/en not_active Expired - Lifetime
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5040066A (en) * | 1973-08-15 | 1975-04-12 | ||
| JPS6070342A (en) * | 1983-09-28 | 1985-04-22 | Hitachi Ltd | X-ray microanalyzer |
| JPS6186640A (en) * | 1984-10-05 | 1986-05-02 | Kawasaki Steel Corp | Quantitative analysis method of concentration of element in x-ray analysis |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0416754A (en) * | 1990-05-11 | 1992-01-21 | Shimadzu Corp | Analyzer |
| KR20040026868A (en) * | 2002-09-26 | 2004-04-01 | 현대자동차주식회사 | Method for Quantitative Analysis of ABS resin |
| JP2020024176A (en) * | 2018-08-08 | 2020-02-13 | 株式会社島津製作所 | Electron probe microanalyzer, data processing method and data processing program |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0752163B2 (en) | 1995-06-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term | ||
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080605 Year of fee payment: 13 |