JPS5446829A - Nephelometry - Google Patents

Nephelometry

Info

Publication number
JPS5446829A
JPS5446829A JP11267577A JP11267577A JPS5446829A JP S5446829 A JPS5446829 A JP S5446829A JP 11267577 A JP11267577 A JP 11267577A JP 11267577 A JP11267577 A JP 11267577A JP S5446829 A JPS5446829 A JP S5446829A
Authority
JP
Japan
Prior art keywords
antigen
amount
scattered light
concentration
wave length
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11267577A
Other languages
Japanese (ja)
Other versions
JPS6058826B2 (en
Inventor
Daizo Tokinaga
Mitsuyoshi Yuasa
Michio Ito
Teruaki Kobayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP11267577A priority Critical patent/JPS6058826B2/en
Publication of JPS5446829A publication Critical patent/JPS5446829A/en
Publication of JPS6058826B2 publication Critical patent/JPS6058826B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule

Abstract

PURPOSE:To determine the amount of an antigen easily and accurately, even in a range where the amount of antigen is excess compared with antibody, with a single nephelometric measurement of an antigen-antibody complex using a light scattering photometer, by determining the intensities of scattered light at two or more wave lengths. CONSTITUTION:In a nehelometry for immunological analysis, two or more light beams having different wave length (e.g. 400nm and 800nm) are let in single specimen simultaneously or successively, and the intensity of scattered light is measured for each wave length. Concentration of the objective compound is determined using calibration curves, and when all concentrations obtained from various wave lengths coincide each other, it is assumed as the true concentration.
JP11267577A 1977-09-21 1977-09-21 Nephelometry method Expired JPS6058826B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11267577A JPS6058826B2 (en) 1977-09-21 1977-09-21 Nephelometry method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11267577A JPS6058826B2 (en) 1977-09-21 1977-09-21 Nephelometry method

Publications (2)

Publication Number Publication Date
JPS5446829A true JPS5446829A (en) 1979-04-13
JPS6058826B2 JPS6058826B2 (en) 1985-12-21

Family

ID=14592654

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11267577A Expired JPS6058826B2 (en) 1977-09-21 1977-09-21 Nephelometry method

Country Status (1)

Country Link
JP (1) JPS6058826B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS576344A (en) * 1980-06-13 1982-01-13 Joko:Kk Method for removing noise in immune nephelometric analyzing apparatus
JPS61280568A (en) * 1985-06-05 1986-12-11 Toa Medical Electronics Co Ltd Method for measuring components in bodily fluids
JPS63138266A (en) * 1986-11-28 1988-06-10 Shimadzu Corp Method for measuring antigen-antibody reaction
JPH06509646A (en) * 1991-07-26 1994-10-27 デイド・ケミストリイ・システムズ・インコーポレーテツド Signal detection assay in the presence of suspended solid support

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS576344A (en) * 1980-06-13 1982-01-13 Joko:Kk Method for removing noise in immune nephelometric analyzing apparatus
JPS61280568A (en) * 1985-06-05 1986-12-11 Toa Medical Electronics Co Ltd Method for measuring components in bodily fluids
JPS63138266A (en) * 1986-11-28 1988-06-10 Shimadzu Corp Method for measuring antigen-antibody reaction
JPH06509646A (en) * 1991-07-26 1994-10-27 デイド・ケミストリイ・システムズ・インコーポレーテツド Signal detection assay in the presence of suspended solid support

Also Published As

Publication number Publication date
JPS6058826B2 (en) 1985-12-21

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