JPS576344A - Method for removing noise in immune nephelometric analyzing apparatus - Google Patents
Method for removing noise in immune nephelometric analyzing apparatusInfo
- Publication number
- JPS576344A JPS576344A JP7966780A JP7966780A JPS576344A JP S576344 A JPS576344 A JP S576344A JP 7966780 A JP7966780 A JP 7966780A JP 7966780 A JP7966780 A JP 7966780A JP S576344 A JPS576344 A JP S576344A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- inputted
- scattered light
- antibody reaction
- detected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
Abstract
PURPOSE:To detect true antigen antibody reaction by eliminating the production of the noises produced by dusts or bubbles which are irrespective of antigen antibody reaction or the clouding and the like of mixed solns. per se. CONSTITUTION:The quantity of scattered light by the antigen antibody reaction in reagent mixed soln. is detected with an photoelectron multiplier 1, and the output of the multiplier 1 is inputted to a primary waveform shaping circuit 5 via a preamplifier 2, a multiplexer 3 and an amplifier 4, whereby the spikes of the detected waveforms are waveform shaped vertically oppositely. The output of the circuit 5 is inputted via a filter 6 to an automatic base correcting circuit 7, by which the ground level is subtracted successively from the quantity of the scattered light, and thereafter, it is inputted to a computer 13 via a peak holding circut 8, a secondary waveform shaping circuit 9, a filter 10, a differentiating circuit 11, and an A/D converter 12. Thereby, noises are thoroughly removed, and the true maximum change rate of the quantity of the scattered light is detected.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7966780A JPS576344A (en) | 1980-06-13 | 1980-06-13 | Method for removing noise in immune nephelometric analyzing apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7966780A JPS576344A (en) | 1980-06-13 | 1980-06-13 | Method for removing noise in immune nephelometric analyzing apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS576344A true JPS576344A (en) | 1982-01-13 |
Family
ID=13696517
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7966780A Pending JPS576344A (en) | 1980-06-13 | 1980-06-13 | Method for removing noise in immune nephelometric analyzing apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS576344A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS595523A (en) * | 1982-06-30 | 1984-01-12 | 松下電工株式会社 | Photoelectric switch unit |
JPS63253864A (en) * | 1987-04-10 | 1988-10-20 | Nippon Chemicon Corp | Dc-dc converter |
JPS63253863A (en) * | 1987-04-10 | 1988-10-20 | Nippon Chemicon Corp | Dc-dc converter |
US4798664A (en) * | 1985-12-25 | 1989-01-17 | Terumo Kabushiki Kaisha | Ion sensor |
US4816118A (en) * | 1986-01-24 | 1989-03-28 | Terumo Corporation | Ion-sensitive FET sensor |
US5139626A (en) * | 1985-10-02 | 1992-08-18 | Terumo Corporation | Ion concentration measurement method |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5313492A (en) * | 1976-06-02 | 1978-02-07 | Beckman Instruments Inc | Process and method for immunity nephelometry |
JPS5440680A (en) * | 1977-09-07 | 1979-03-30 | Hitachi Ltd | Nephelometer |
JPS5446829A (en) * | 1977-09-21 | 1979-04-13 | Hitachi Ltd | Nephelometry |
-
1980
- 1980-06-13 JP JP7966780A patent/JPS576344A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5313492A (en) * | 1976-06-02 | 1978-02-07 | Beckman Instruments Inc | Process and method for immunity nephelometry |
JPS5440680A (en) * | 1977-09-07 | 1979-03-30 | Hitachi Ltd | Nephelometer |
JPS5446829A (en) * | 1977-09-21 | 1979-04-13 | Hitachi Ltd | Nephelometry |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS595523A (en) * | 1982-06-30 | 1984-01-12 | 松下電工株式会社 | Photoelectric switch unit |
US5139626A (en) * | 1985-10-02 | 1992-08-18 | Terumo Corporation | Ion concentration measurement method |
US4798664A (en) * | 1985-12-25 | 1989-01-17 | Terumo Kabushiki Kaisha | Ion sensor |
US4816118A (en) * | 1986-01-24 | 1989-03-28 | Terumo Corporation | Ion-sensitive FET sensor |
JPS63253864A (en) * | 1987-04-10 | 1988-10-20 | Nippon Chemicon Corp | Dc-dc converter |
JPS63253863A (en) * | 1987-04-10 | 1988-10-20 | Nippon Chemicon Corp | Dc-dc converter |
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