SU503169A1 - The method of determining the transparency of the sample - Google Patents

The method of determining the transparency of the sample

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Publication number
SU503169A1
SU503169A1 SU1905745A SU1905745A SU503169A1 SU 503169 A1 SU503169 A1 SU 503169A1 SU 1905745 A SU1905745 A SU 1905745A SU 1905745 A SU1905745 A SU 1905745A SU 503169 A1 SU503169 A1 SU 503169A1
Authority
SU
USSR - Soviet Union
Prior art keywords
sample
substrate
ref
reflecting
determining
Prior art date
Application number
SU1905745A
Other languages
Russian (ru)
Inventor
Олег Иванович Ястребов
Original Assignee
Украинский Научно-Исследовательский Институт Целлюлозно-Бумажной Промышленности Укрнииб
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Украинский Научно-Исследовательский Институт Целлюлозно-Бумажной Промышленности Укрнииб filed Critical Украинский Научно-Исследовательский Институт Целлюлозно-Бумажной Промышленности Укрнииб
Priority to SU1905745A priority Critical patent/SU503169A1/en
Application granted granted Critical
Publication of SU503169A1 publication Critical patent/SU503169A1/en

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Description

1one

Изобретение относитс  к способам определени  светопроницаемости образцов.The invention relates to methods for determining the transparency of samples.

Известные способы определени  светопроницаемости образца основаны на фотометрических измерени х отношени  прошедшего через образец светового потока к падаюш,ему.The known methods for determining the translucency of a sample are based on photometric measurements of the ratio of the light flux transmitted through the sample to the fallout.

Однако известные способы определени  светопроницаемости образца не позвол ют получить требуемую точность.However, the known methods for determining the transparency of a sample do not allow for obtaining the required accuracy.

Цель изобретени  - повышение точности измерений. Это достигают за счет того, что под образцом помеш,ают подложку, содержаш ,ую отражаюш,ую п поглош;аюш,ую части, определ ют коэффициенты отражени  образца , помеш,а  под ним поочередно обе части подложки, затем измер ют коэффициент отражени  отражающей части подложки и по функциональной зависимости между полученными результатами и светопроницаемостью, последнюю определ ют из выражени :The purpose of the invention is to improve the measurement accuracy. This is achieved by holding the substrate under the sample, containing the substrate, reflecting, absorbing the sample, determining the reflection coefficients of the specimen, interrupting, and alternately, both parts of the substrate, then measuring the reflectance of the reflecting part of the substrate and the functional relationship between the results and the transmittance, the latter is determined from the expression:

(АОТР (AOTR

1  one

VV

J,J

отр. отр. чRef. Ref. h

где т-светопроницаемость образца; отр и погл - коэффициенты отражени  образца, расположенного над отражающей и поглощающей част ми подложки, соответственно;where t is the translucency of the sample; Ref and Abs are the reflection coefficients of a sample located above the reflecting and absorbing portions of the substrate, respectively;

.отр.ч - коэффициент отражени  отражающей части подложки..r.r is the reflection coefficient of the reflecting part of the substrate.

Claims (1)

Формула изобретени Invention Formula Способ определени  светопроницаемости образца, при осуществлении которого на образец направл ют световой поток, измер ют падающий и прошедший через него световые потоки, отличающийс  тем, что, с целью повышени  точности измерений, под образцом помещают подложку, содержащую отражающую и поглощающую части, определ ют коэффициенты отражени  образца, помеща  под ним поочередно обе части подложки, затем измер ют коэффициент отражени  отражающей части подложки и по функциональной зависимости между полученными результатами и светопроницаемостью последнюю определ ют из выражени .The method of determining the transparency of the sample, in which the light flux is directed to the sample, measures the incident and transmitted light streams, characterized in that, in order to improve measurement accuracy, the substrate containing the reflecting and absorbing parts is placed under the sample, the coefficients reflecting the sample, placing both parts of the substrate alternately underneath, then measuring the reflection coefficient of the reflecting part of the substrate and by the functional relationship between the results obtained and the svetopron The consistency of the latter is determined from the expression. |/(отр 1| / (ref 1 п P -g АПОГЛ) АПОГЛ I APOGL) APOGL I й„th „ отр. отр. чRef. Ref. h где Т-светопроницаемость образца; отр и - погот - коэффициенты отражени  образца, расположенного над отражающей и поглощающей част ми подложки соответственно; .отр.ч - коэффициент отражени  отражающей части подложки.where T is the translucency of the sample; Ref and - Pogot - the reflection coefficients of the sample located above the reflecting and absorbing portions of the substrate, respectively; .r.r is the reflection coefficient of the reflecting part of the substrate.
SU1905745A 1973-04-11 1973-04-11 The method of determining the transparency of the sample SU503169A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SU1905745A SU503169A1 (en) 1973-04-11 1973-04-11 The method of determining the transparency of the sample

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU1905745A SU503169A1 (en) 1973-04-11 1973-04-11 The method of determining the transparency of the sample

Publications (1)

Publication Number Publication Date
SU503169A1 true SU503169A1 (en) 1976-02-15

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Family Applications (1)

Application Number Title Priority Date Filing Date
SU1905745A SU503169A1 (en) 1973-04-11 1973-04-11 The method of determining the transparency of the sample

Country Status (1)

Country Link
SU (1) SU503169A1 (en)

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