JPS5326183A - X-ray analyzer - Google Patents

X-ray analyzer

Info

Publication number
JPS5326183A
JPS5326183A JP10093176A JP10093176A JPS5326183A JP S5326183 A JPS5326183 A JP S5326183A JP 10093176 A JP10093176 A JP 10093176A JP 10093176 A JP10093176 A JP 10093176A JP S5326183 A JPS5326183 A JP S5326183A
Authority
JP
Japan
Prior art keywords
ray analyzer
xrays
specimen
withdrawn
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10093176A
Other languages
Japanese (ja)
Other versions
JPS5426915B2 (en
Inventor
Ichiro Wada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP10093176A priority Critical patent/JPS5326183A/en
Publication of JPS5326183A publication Critical patent/JPS5326183A/en
Publication of JPS5426915B2 publication Critical patent/JPS5426915B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:Measuring of the X-ray intensity of desired elements is made possible with a minimum space by making flexible the side to be provided with a detector out of the plural tube bodies provided to the advancing direction of the Xrays withdrawn from a specimen.
JP10093176A 1976-08-24 1976-08-24 X-ray analyzer Granted JPS5326183A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10093176A JPS5326183A (en) 1976-08-24 1976-08-24 X-ray analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10093176A JPS5326183A (en) 1976-08-24 1976-08-24 X-ray analyzer

Publications (2)

Publication Number Publication Date
JPS5326183A true JPS5326183A (en) 1978-03-10
JPS5426915B2 JPS5426915B2 (en) 1979-09-06

Family

ID=14287084

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10093176A Granted JPS5326183A (en) 1976-08-24 1976-08-24 X-ray analyzer

Country Status (1)

Country Link
JP (1) JPS5326183A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61176443U (en) * 1984-12-31 1986-11-04
JPS6232356U (en) * 1985-08-13 1987-02-26
JPS62113051A (en) * 1985-11-13 1987-05-23 Kawasaki Steel Corp Method and apparatus for measuring x ray diffraction for thin film layer

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS632988Y2 (en) * 1980-07-21 1988-01-25

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5028274A (en) * 1973-07-13 1975-03-22

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5028274A (en) * 1973-07-13 1975-03-22

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61176443U (en) * 1984-12-31 1986-11-04
JPH0448525Y2 (en) * 1984-12-31 1992-11-16
JPS6232356U (en) * 1985-08-13 1987-02-26
JPS62113051A (en) * 1985-11-13 1987-05-23 Kawasaki Steel Corp Method and apparatus for measuring x ray diffraction for thin film layer

Also Published As

Publication number Publication date
JPS5426915B2 (en) 1979-09-06

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