JPS56147354A - Mass spectrograph - Google Patents

Mass spectrograph

Info

Publication number
JPS56147354A
JPS56147354A JP4918880A JP4918880A JPS56147354A JP S56147354 A JPS56147354 A JP S56147354A JP 4918880 A JP4918880 A JP 4918880A JP 4918880 A JP4918880 A JP 4918880A JP S56147354 A JPS56147354 A JP S56147354A
Authority
JP
Japan
Prior art keywords
magnetic field
mass number
ion
electric field
intensity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4918880A
Other languages
Japanese (ja)
Other versions
JPH0211977B2 (en
Inventor
Sadao Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP4918880A priority Critical patent/JPS56147354A/en
Publication of JPS56147354A publication Critical patent/JPS56147354A/en
Publication of JPH0211977B2 publication Critical patent/JPH0211977B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers
    • H01J49/32Static spectrometers using double focusing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To enable the detection of meta-stable ions of particular ions, by scanning the intensity of magnetic field while scanning the electric field voltage when said intensity will reach the level corresponding to the peak of the mass number of the ion to be detected. CONSTITUTION:The component of the specimen analyzed by a gas chromatograph 1 will enter through an ion source 2 into an electric field 5 to be focused into a slit 6, then enters into a magnetic field 7 and detected by a collector 9. The electric field 5 and the magnetic field 7 are connected through D/A converters 11, 14 to an operation control section 12 to operate the magnetic field with predetermined period, and when the intensity of the magnetic field will reach the peak level of different mass number of every scan the voltage of the electric field 5 is operated. Consequently the meta-stable ion for the peak of mass number of ion having different mass number in time sharing can be obtained simultaneously within the period where the component material is resolved from the separated column.
JP4918880A 1980-04-16 1980-04-16 Mass spectrograph Granted JPS56147354A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4918880A JPS56147354A (en) 1980-04-16 1980-04-16 Mass spectrograph

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4918880A JPS56147354A (en) 1980-04-16 1980-04-16 Mass spectrograph

Publications (2)

Publication Number Publication Date
JPS56147354A true JPS56147354A (en) 1981-11-16
JPH0211977B2 JPH0211977B2 (en) 1990-03-16

Family

ID=12824043

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4918880A Granted JPS56147354A (en) 1980-04-16 1980-04-16 Mass spectrograph

Country Status (1)

Country Link
JP (1) JPS56147354A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59147251A (en) * 1983-02-10 1984-08-23 Jeol Ltd Linked scan mass spectroscope

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52149191A (en) * 1976-06-07 1977-12-12 Hitachi Ltd Metastable ion detector

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52149191A (en) * 1976-06-07 1977-12-12 Hitachi Ltd Metastable ion detector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59147251A (en) * 1983-02-10 1984-08-23 Jeol Ltd Linked scan mass spectroscope

Also Published As

Publication number Publication date
JPH0211977B2 (en) 1990-03-16

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