JPS5723457A - Mass spectrometer - Google Patents

Mass spectrometer

Info

Publication number
JPS5723457A
JPS5723457A JP9711280A JP9711280A JPS5723457A JP S5723457 A JPS5723457 A JP S5723457A JP 9711280 A JP9711280 A JP 9711280A JP 9711280 A JP9711280 A JP 9711280A JP S5723457 A JPS5723457 A JP S5723457A
Authority
JP
Japan
Prior art keywords
slit
ions
plate
channel plate
high resolution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9711280A
Other languages
Japanese (ja)
Other versions
JPS6360497B2 (en
Inventor
Norihiro Naito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP9711280A priority Critical patent/JPS5723457A/en
Publication of JPS5723457A publication Critical patent/JPS5723457A/en
Publication of JPS6360497B2 publication Critical patent/JPS6360497B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

PURPOSE:To make easily the selection of high sensitivity measurement and high resolution measurement, by making the device to be capable of inserting a slit plate between a channel plate and analysing magnetic field in order to obtain a high resolution spectrum. CONSTITUTION:A slit 6 and channel plate 7 are provided on the focus plane (P) and under the slit 6 respectively, ions which have passed the slit plate 6 come on the channel plate. Secondary electrons generated by incidence of ions in each multiplier tube with microdiameter are multiplied by 10<4>-10<6> with multiplying effect, and enter into a multicollector unit 8 provided under the channel plate 7. The slit plate 6 is devided into two steps of lower and upper, made movable vertically, and all ions which are spread as a spectrum can pass when the lower step is used, the ions can pass only limited plural number of slit when the upper step is used. Thus the sensitivity measurement and high resolution measurement can be easily selected.
JP9711280A 1980-07-16 1980-07-16 Mass spectrometer Granted JPS5723457A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9711280A JPS5723457A (en) 1980-07-16 1980-07-16 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9711280A JPS5723457A (en) 1980-07-16 1980-07-16 Mass spectrometer

Publications (2)

Publication Number Publication Date
JPS5723457A true JPS5723457A (en) 1982-02-06
JPS6360497B2 JPS6360497B2 (en) 1988-11-24

Family

ID=14183490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9711280A Granted JPS5723457A (en) 1980-07-16 1980-07-16 Mass spectrometer

Country Status (1)

Country Link
JP (1) JPS5723457A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61245046A (en) * 1985-04-22 1986-10-31 Natl Inst For Res In Inorg Mater Ion scattering spectral device
JPS6354246U (en) * 1986-09-26 1988-04-12
LU502891B1 (en) * 2022-10-12 2024-04-12 Luxembourg Inst Science & Tech List Device and method for high resolution beam analysis

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5661753A (en) * 1979-10-23 1981-05-27 Denshi Kagaku Kk Detection method and detection apparatus of ions such as gas chromatograph

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5661753A (en) * 1979-10-23 1981-05-27 Denshi Kagaku Kk Detection method and detection apparatus of ions such as gas chromatograph

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61245046A (en) * 1985-04-22 1986-10-31 Natl Inst For Res In Inorg Mater Ion scattering spectral device
JPS6354246U (en) * 1986-09-26 1988-04-12
LU502891B1 (en) * 2022-10-12 2024-04-12 Luxembourg Inst Science & Tech List Device and method for high resolution beam analysis
WO2024079201A1 (en) * 2022-10-12 2024-04-18 Luxembourg Institute Of Science And Technology (List) Device and method for high resolution beam analysis

Also Published As

Publication number Publication date
JPS6360497B2 (en) 1988-11-24

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