JPS5727553A - Adjusting method for ion source of mass-spectrometer - Google Patents

Adjusting method for ion source of mass-spectrometer

Info

Publication number
JPS5727553A
JPS5727553A JP10208980A JP10208980A JPS5727553A JP S5727553 A JPS5727553 A JP S5727553A JP 10208980 A JP10208980 A JP 10208980A JP 10208980 A JP10208980 A JP 10208980A JP S5727553 A JPS5727553 A JP S5727553A
Authority
JP
Japan
Prior art keywords
voltage
sweep
voltages
stepwise
fed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10208980A
Other languages
Japanese (ja)
Other versions
JPS6329787B2 (en
Inventor
Toru Asada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP10208980A priority Critical patent/JPS5727553A/en
Publication of JPS5727553A publication Critical patent/JPS5727553A/en
Publication of JPS6329787B2 publication Critical patent/JPS6329787B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To adjust the ion source in an optimal condition automatically, by conducting the mass number sweep in order focus voltage, repeller voltage, and acceleration voltage in a state of gradual change in order to determine the value at which a peak of a specific ion attains the maximum. CONSTITUTION:Two voltages among three voltages to be adjusted, that is repeller voltage fed to a repeller electrode, acceleration voltage Va, and focus voltage Vf fed to the first focus slit 12, are fixed and a residual voltage to be adjusted is changed with dispatching signal stepwise. Then the sweep signal is fed to a power source 21 stepwise to sweep the electric field, and the mass number of the ion which enters into a collector 6 is swept. Intensities of stepwise peaks of a specific ion in the spectrum signal which is obtained as a detection signal from the collector 6 through the mass number sweep are picked up, and the optimal voltage Vo at which the peak attains to the maximum intensity is determined. Then the voltage to be adjusted is set at the optimal voltage Vo. And then above mentioned operation is repeated concerning the residual two voltages. The order of operation is from Vf, Vr, to Va.
JP10208980A 1980-07-25 1980-07-25 Adjusting method for ion source of mass-spectrometer Granted JPS5727553A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10208980A JPS5727553A (en) 1980-07-25 1980-07-25 Adjusting method for ion source of mass-spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10208980A JPS5727553A (en) 1980-07-25 1980-07-25 Adjusting method for ion source of mass-spectrometer

Publications (2)

Publication Number Publication Date
JPS5727553A true JPS5727553A (en) 1982-02-13
JPS6329787B2 JPS6329787B2 (en) 1988-06-15

Family

ID=14318042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10208980A Granted JPS5727553A (en) 1980-07-25 1980-07-25 Adjusting method for ion source of mass-spectrometer

Country Status (1)

Country Link
JP (1) JPS5727553A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5532483A (en) * 1994-03-17 1996-07-02 Hitachi, Ltd. Mass spectrometer and ion source
JP2011151008A (en) * 2010-01-19 2011-08-04 Agilent Technologies Inc System and method for exchanging ion source of mass spectrometer
WO2013065173A1 (en) * 2011-11-04 2013-05-10 株式会社島津製作所 Mass spectroscopy apparatus
WO2013140558A1 (en) * 2012-03-22 2013-09-26 株式会社島津製作所 Mass analysis device

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5532483A (en) * 1994-03-17 1996-07-02 Hitachi, Ltd. Mass spectrometer and ion source
JP2011151008A (en) * 2010-01-19 2011-08-04 Agilent Technologies Inc System and method for exchanging ion source of mass spectrometer
WO2013065173A1 (en) * 2011-11-04 2013-05-10 株式会社島津製作所 Mass spectroscopy apparatus
CN104025248A (en) * 2011-11-04 2014-09-03 株式会社岛津制作所 Mass spectroscopy apparatus
US8927927B2 (en) 2011-11-04 2015-01-06 Shimadzu Corporation Mass spectrometer
JPWO2013065173A1 (en) * 2011-11-04 2015-04-02 株式会社島津製作所 Mass spectrometer
WO2013140558A1 (en) * 2012-03-22 2013-09-26 株式会社島津製作所 Mass analysis device

Also Published As

Publication number Publication date
JPS6329787B2 (en) 1988-06-15

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