JPS56167249A - Ion analizer - Google Patents
Ion analizerInfo
- Publication number
- JPS56167249A JPS56167249A JP7169280A JP7169280A JPS56167249A JP S56167249 A JPS56167249 A JP S56167249A JP 7169280 A JP7169280 A JP 7169280A JP 7169280 A JP7169280 A JP 7169280A JP S56167249 A JPS56167249 A JP S56167249A
- Authority
- JP
- Japan
- Prior art keywords
- ion
- ions
- mass filter
- projected
- analyzed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
PURPOSE:To quickly analize ions in a very short time by assembling the captional ion analyzer with an energy analyzer which separates and expands the generated ions, a plural number of tetrode mass spectroscopes, and a detector which detects the ions passing through these analyzers separately. CONSTITUTION:Energy beam 2, such as ion beam, etc. is irradiated on a sample 1. An analyzed ion 3 generated from the irradiated point is projected on an analytical electric field E provided above the sample 1 and separated depending upon the energy possessed by the ion. This electric field E is created by electrodes 4 and 4'. Each analyzed ion is projected on a mass filter 5 through a slit plate 6. The ion passing through the mass filter 5 is projected on a secondary electron multiplier detector 8 through an output slit plate 7 and detected by every Q mass filter independently. The detection signals obtained by every Q mass filter are sent to a computer 9 and processed. Thus ions can be analyzed quickly in a short time.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7169280A JPS56167249A (en) | 1980-05-29 | 1980-05-29 | Ion analizer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7169280A JPS56167249A (en) | 1980-05-29 | 1980-05-29 | Ion analizer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56167249A true JPS56167249A (en) | 1981-12-22 |
JPS6329784B2 JPS6329784B2 (en) | 1988-06-15 |
Family
ID=13467845
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7169280A Granted JPS56167249A (en) | 1980-05-29 | 1980-05-29 | Ion analizer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56167249A (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5511334A (en) * | 1978-07-11 | 1980-01-26 | Fujitsu Ltd | Method of marking printed board |
-
1980
- 1980-05-29 JP JP7169280A patent/JPS56167249A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5511334A (en) * | 1978-07-11 | 1980-01-26 | Fujitsu Ltd | Method of marking printed board |
Also Published As
Publication number | Publication date |
---|---|
JPS6329784B2 (en) | 1988-06-15 |
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