JPS5730254A - Complex surface analyzer - Google Patents
Complex surface analyzerInfo
- Publication number
- JPS5730254A JPS5730254A JP10532880A JP10532880A JPS5730254A JP S5730254 A JPS5730254 A JP S5730254A JP 10532880 A JP10532880 A JP 10532880A JP 10532880 A JP10532880 A JP 10532880A JP S5730254 A JPS5730254 A JP S5730254A
- Authority
- JP
- Japan
- Prior art keywords
- ion
- specimen
- spectrograph
- mass
- analyzer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
PURPOSE:To simplify and to reduce the size of an analyzer by arranging a rolling frame at the rear of an electrostatic energy analyzer while providing a series arrangement of a triple pole mass-spectrograph and a charged particle detector, and a charged particle detector. CONSTITUTION:An ion gun 3 is operated to irradiate a specimen 4 with an ion beam of rare gas then the energy selection is performed on the secondary ion emitted from the specimen 4 by means of an energy analyzer 5 thereafter it is provided through a slit 11 to a triple pole mass-spectrograph 8 to perform the mass separation and detected by an electron multiplier tube 9 thus to perform the secondary ion mass spectrograph. When the radius beam passing through the slit 10 is coincided with the center line of a particle beam flux produced from the energy analyzer 5, the ion scattering spectral analysis is performed. While when an electron gun 1 or an X-ray source 2 is operated to irradiate the specimen 4 with an electron beam or X-ray, auger electrospectral analysis or X-ray photoelectric spectral analysis is performed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10532880A JPS5730254A (en) | 1980-07-30 | 1980-07-30 | Complex surface analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10532880A JPS5730254A (en) | 1980-07-30 | 1980-07-30 | Complex surface analyzer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5730254A true JPS5730254A (en) | 1982-02-18 |
JPS645745B2 JPS645745B2 (en) | 1989-01-31 |
Family
ID=14404647
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10532880A Granted JPS5730254A (en) | 1980-07-30 | 1980-07-30 | Complex surface analyzer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5730254A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0272924A (en) * | 1988-09-08 | 1990-03-13 | Sekisui Plastics Co Ltd | Cooling device for resin molding |
-
1980
- 1980-07-30 JP JP10532880A patent/JPS5730254A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0272924A (en) * | 1988-09-08 | 1990-03-13 | Sekisui Plastics Co Ltd | Cooling device for resin molding |
Also Published As
Publication number | Publication date |
---|---|
JPS645745B2 (en) | 1989-01-31 |
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