JPS56103443A - Production of element isolation structure for semiconductor device - Google Patents
Production of element isolation structure for semiconductor deviceInfo
- Publication number
- JPS56103443A JPS56103443A JP557380A JP557380A JPS56103443A JP S56103443 A JPS56103443 A JP S56103443A JP 557380 A JP557380 A JP 557380A JP 557380 A JP557380 A JP 557380A JP S56103443 A JPS56103443 A JP S56103443A
- Authority
- JP
- Japan
- Prior art keywords
- film
- poly
- layer
- sio2 film
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10W10/0121—
-
- H10W10/0126—
-
- H10W10/13—
Landscapes
- Local Oxidation Of Silicon (AREA)
- Element Separation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP557380A JPS56103443A (en) | 1980-01-21 | 1980-01-21 | Production of element isolation structure for semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP557380A JPS56103443A (en) | 1980-01-21 | 1980-01-21 | Production of element isolation structure for semiconductor device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS56103443A true JPS56103443A (en) | 1981-08-18 |
| JPS6310896B2 JPS6310896B2 (ref) | 1988-03-10 |
Family
ID=11614956
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP557380A Granted JPS56103443A (en) | 1980-01-21 | 1980-01-21 | Production of element isolation structure for semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56103443A (ref) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5873163A (ja) * | 1981-10-27 | 1983-05-02 | Toshiba Corp | Mos型半導体装置 |
| US4818235A (en) * | 1987-02-10 | 1989-04-04 | Industry Technology Research Institute | Isolation structures for integrated circuits |
| US4927780A (en) * | 1989-10-02 | 1990-05-22 | Motorola, Inc. | Encapsulation method for localized oxidation of silicon |
| US4980311A (en) * | 1987-05-05 | 1990-12-25 | Seiko Epson Corporation | Method of fabricating a semiconductor device |
| US6306726B1 (en) * | 1999-08-30 | 2001-10-23 | Micron Technology, Inc. | Method of forming field oxide |
-
1980
- 1980-01-21 JP JP557380A patent/JPS56103443A/ja active Granted
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5873163A (ja) * | 1981-10-27 | 1983-05-02 | Toshiba Corp | Mos型半導体装置 |
| US4818235A (en) * | 1987-02-10 | 1989-04-04 | Industry Technology Research Institute | Isolation structures for integrated circuits |
| US4980311A (en) * | 1987-05-05 | 1990-12-25 | Seiko Epson Corporation | Method of fabricating a semiconductor device |
| US4927780A (en) * | 1989-10-02 | 1990-05-22 | Motorola, Inc. | Encapsulation method for localized oxidation of silicon |
| US6306726B1 (en) * | 1999-08-30 | 2001-10-23 | Micron Technology, Inc. | Method of forming field oxide |
| US6326672B1 (en) | 1999-08-30 | 2001-12-04 | Micron Technology, Inc. | LOCOS fabrication processes and semiconductive material structures |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6310896B2 (ref) | 1988-03-10 |
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