JPS56100416A - Method and device for correcting mask - Google Patents
Method and device for correcting maskInfo
- Publication number
- JPS56100416A JPS56100416A JP328180A JP328180A JPS56100416A JP S56100416 A JPS56100416 A JP S56100416A JP 328180 A JP328180 A JP 328180A JP 328180 A JP328180 A JP 328180A JP S56100416 A JPS56100416 A JP S56100416A
- Authority
- JP
- Japan
- Prior art keywords
- mask
- correction
- camera
- light
- constitution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/72—Repair or correction of mask defects
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/82—Auxiliary processes, e.g. cleaning or inspecting
- G03F1/84—Inspecting
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP328180A JPS56100416A (en) | 1980-01-16 | 1980-01-16 | Method and device for correcting mask |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP328180A JPS56100416A (en) | 1980-01-16 | 1980-01-16 | Method and device for correcting mask |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56100416A true JPS56100416A (en) | 1981-08-12 |
JPS6217745B2 JPS6217745B2 (enrdf_load_stackoverflow) | 1987-04-20 |
Family
ID=11553027
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP328180A Granted JPS56100416A (en) | 1980-01-16 | 1980-01-16 | Method and device for correcting mask |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56100416A (enrdf_load_stackoverflow) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63228163A (ja) * | 1987-03-17 | 1988-09-22 | Toppan Printing Co Ltd | 検版装置 |
JP2002222751A (ja) * | 2001-01-25 | 2002-08-09 | Nitto Kogaku Kk | アライメント装置および組立て装置 |
JP2008066452A (ja) * | 2006-09-06 | 2008-03-21 | Renesas Technology Corp | 半導体装置の製造方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5081685A (enrdf_load_stackoverflow) * | 1973-11-21 | 1975-07-02 | ||
JPS5258373A (en) * | 1975-11-07 | 1977-05-13 | Fujitsu Ltd | Inspection for defects of pattern forming film |
-
1980
- 1980-01-16 JP JP328180A patent/JPS56100416A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5081685A (enrdf_load_stackoverflow) * | 1973-11-21 | 1975-07-02 | ||
JPS5258373A (en) * | 1975-11-07 | 1977-05-13 | Fujitsu Ltd | Inspection for defects of pattern forming film |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63228163A (ja) * | 1987-03-17 | 1988-09-22 | Toppan Printing Co Ltd | 検版装置 |
JP2002222751A (ja) * | 2001-01-25 | 2002-08-09 | Nitto Kogaku Kk | アライメント装置および組立て装置 |
JP2008066452A (ja) * | 2006-09-06 | 2008-03-21 | Renesas Technology Corp | 半導体装置の製造方法 |
Also Published As
Publication number | Publication date |
---|---|
JPS6217745B2 (enrdf_load_stackoverflow) | 1987-04-20 |
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