JPS5583234A - Electron beam exposure - Google Patents
Electron beam exposureInfo
- Publication number
- JPS5583234A JPS5583234A JP15964378A JP15964378A JPS5583234A JP S5583234 A JPS5583234 A JP S5583234A JP 15964378 A JP15964378 A JP 15964378A JP 15964378 A JP15964378 A JP 15964378A JP S5583234 A JPS5583234 A JP S5583234A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- energy
- absorbed
- electron beam
- resist
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analytical Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Electron Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15964378A JPS5583234A (en) | 1978-12-20 | 1978-12-20 | Electron beam exposure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15964378A JPS5583234A (en) | 1978-12-20 | 1978-12-20 | Electron beam exposure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5583234A true JPS5583234A (en) | 1980-06-23 |
| JPS627689B2 JPS627689B2 (en:Method) | 1987-02-18 |
Family
ID=15698188
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15964378A Granted JPS5583234A (en) | 1978-12-20 | 1978-12-20 | Electron beam exposure |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5583234A (en:Method) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5843516A (ja) * | 1981-09-08 | 1983-03-14 | Fujitsu Ltd | 電子ビ−ム露光方法 |
| JPS5861628A (ja) * | 1981-10-08 | 1983-04-12 | Nippon Telegr & Teleph Corp <Ntt> | 電子ビ−ム露光における近接効果補正方法 |
| JPS59112621A (ja) * | 1982-12-20 | 1984-06-29 | Fujitsu Ltd | 電子ビ−ム露光方法 |
| JPS59172233A (ja) * | 1983-03-19 | 1984-09-28 | Fujitsu Ltd | 電子ビ−ム露光方法 |
-
1978
- 1978-12-20 JP JP15964378A patent/JPS5583234A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5843516A (ja) * | 1981-09-08 | 1983-03-14 | Fujitsu Ltd | 電子ビ−ム露光方法 |
| JPS5861628A (ja) * | 1981-10-08 | 1983-04-12 | Nippon Telegr & Teleph Corp <Ntt> | 電子ビ−ム露光における近接効果補正方法 |
| JPS59112621A (ja) * | 1982-12-20 | 1984-06-29 | Fujitsu Ltd | 電子ビ−ム露光方法 |
| JPS59172233A (ja) * | 1983-03-19 | 1984-09-28 | Fujitsu Ltd | 電子ビ−ム露光方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS627689B2 (en:Method) | 1987-02-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term | ||
| S531 | Written request for registration of change of domicile |
Free format text: JAPANESE INTERMEDIATE CODE: R313532 |
|
| R360 | Written notification for declining of transfer of rights |
Free format text: JAPANESE INTERMEDIATE CODE: R360 |
|
| R370 | Written measure of declining of transfer procedure |
Free format text: JAPANESE INTERMEDIATE CODE: R370 |