JPS5524680A - Measurement of thickness of metal coating and component of another metal in the coating film - Google Patents

Measurement of thickness of metal coating and component of another metal in the coating film

Info

Publication number
JPS5524680A
JPS5524680A JP9851378A JP9851378A JPS5524680A JP S5524680 A JPS5524680 A JP S5524680A JP 9851378 A JP9851378 A JP 9851378A JP 9851378 A JP9851378 A JP 9851378A JP S5524680 A JPS5524680 A JP S5524680A
Authority
JP
Japan
Prior art keywords
ray
pulses
preset
steel plate
metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9851378A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6367121B2 (enrdf_load_stackoverflow
Inventor
Masakatsu Fujino
Takashi Ochiai
Yoshiro Matsumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP9851378A priority Critical patent/JPS5524680A/ja
Publication of JPS5524680A publication Critical patent/JPS5524680A/ja
Publication of JPS6367121B2 publication Critical patent/JPS6367121B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)
JP9851378A 1978-08-11 1978-08-11 Measurement of thickness of metal coating and component of another metal in the coating film Granted JPS5524680A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9851378A JPS5524680A (en) 1978-08-11 1978-08-11 Measurement of thickness of metal coating and component of another metal in the coating film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9851378A JPS5524680A (en) 1978-08-11 1978-08-11 Measurement of thickness of metal coating and component of another metal in the coating film

Publications (2)

Publication Number Publication Date
JPS5524680A true JPS5524680A (en) 1980-02-21
JPS6367121B2 JPS6367121B2 (enrdf_load_stackoverflow) 1988-12-23

Family

ID=14221722

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9851378A Granted JPS5524680A (en) 1978-08-11 1978-08-11 Measurement of thickness of metal coating and component of another metal in the coating film

Country Status (1)

Country Link
JP (1) JPS5524680A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5850412A (ja) * 1981-09-22 1983-03-24 Rigaku Denki Kogyo Kk 金属被膜の膜厚または金属被膜中の各元素の含有量の測定方法
JPS58219403A (ja) * 1982-06-16 1983-12-20 Aloka Co Ltd 積層被膜の膜厚測定方法
JPH0210144A (ja) * 1988-06-28 1990-01-12 Kawasaki Steel Corp 皮膜の厚みと組成の同時測定方法
US7356114B2 (en) 2005-09-14 2008-04-08 Rigaku Industrial Corporation X-ray fluorescence spectrometer

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52109991A (en) * 1976-03-12 1977-09-14 Nisshin Steel Co Ltd Measuring method for alloyed degree by means of fluorescent x-rays and measuring apparatus therefor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52109991A (en) * 1976-03-12 1977-09-14 Nisshin Steel Co Ltd Measuring method for alloyed degree by means of fluorescent x-rays and measuring apparatus therefor

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5850412A (ja) * 1981-09-22 1983-03-24 Rigaku Denki Kogyo Kk 金属被膜の膜厚または金属被膜中の各元素の含有量の測定方法
JPS58219403A (ja) * 1982-06-16 1983-12-20 Aloka Co Ltd 積層被膜の膜厚測定方法
JPH0210144A (ja) * 1988-06-28 1990-01-12 Kawasaki Steel Corp 皮膜の厚みと組成の同時測定方法
US7356114B2 (en) 2005-09-14 2008-04-08 Rigaku Industrial Corporation X-ray fluorescence spectrometer
KR101046018B1 (ko) * 2005-09-14 2011-07-01 가부시키가이샤 리가쿠 형광 ｘ선 분석 장치
CN1932493B (zh) 2005-09-14 2012-01-04 株式会社理学 荧光x射线分析装置

Also Published As

Publication number Publication date
JPS6367121B2 (enrdf_load_stackoverflow) 1988-12-23

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