JPS5524680A - Measurement of thickness of metal coating and component of another metal in the coating film - Google Patents
Measurement of thickness of metal coating and component of another metal in the coating filmInfo
- Publication number
- JPS5524680A JPS5524680A JP9851378A JP9851378A JPS5524680A JP S5524680 A JPS5524680 A JP S5524680A JP 9851378 A JP9851378 A JP 9851378A JP 9851378 A JP9851378 A JP 9851378A JP S5524680 A JPS5524680 A JP S5524680A
- Authority
- JP
- Japan
- Prior art keywords
- ray
- pulses
- preset
- steel plate
- metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating And Analyzing Materials By Characteristic Methods (AREA)
Abstract
PURPOSE: To solve preset simultaneous equations on the basis of two measured values thereby to effect the simultaneous and non-destructive measurements by catching an fluorescent X ray from a metal layer with two kinds of different extraction angles and by respectively measuring the intensities of the X rays having such a frequency as is determined by the composition of the metal coating film.
CONSTITUTION: A zinc-plated steel plate 10, which has been subjected to alloy treatment, is horizontally conveyed in the direction of arrow on a continuously conveying line 1. Above the line 1, an X-ray generating tube 2 is provided to irradiate a radioactive ray toward the steel plate 10 so that the fluorescent X-ray is detected from the steel plate 10 at an extraction angle different from that of a detecting element 3 at U. The detecting element 3 and 4 generate pulses, which have such peak values as are proportional to the intensity of the X-rays incident thereon, and these pulses are amplified to a preset level each by an amplifier 5. The amplified outputs are subjected to selection by peak selectors 61 and 62 thereby to select the pulses having preset peak values so that the numbers of the pulses is counted by each of counting circuits 71 and 72 to detect the intensity of the characteristic X-ray of ZnKa. The outputs of the circuits 71 and 72 are fed to an arithmetic circuit 8, and preset simultaneous equations are solved so that the plating thickness and the alloy degree and determined and displayed in the display unit 9.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9851378A JPS5524680A (en) | 1978-08-11 | 1978-08-11 | Measurement of thickness of metal coating and component of another metal in the coating film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9851378A JPS5524680A (en) | 1978-08-11 | 1978-08-11 | Measurement of thickness of metal coating and component of another metal in the coating film |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5524680A true JPS5524680A (en) | 1980-02-21 |
| JPS6367121B2 JPS6367121B2 (en) | 1988-12-23 |
Family
ID=14221722
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9851378A Granted JPS5524680A (en) | 1978-08-11 | 1978-08-11 | Measurement of thickness of metal coating and component of another metal in the coating film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5524680A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5850412A (en) * | 1981-09-22 | 1983-03-24 | Rigaku Denki Kogyo Kk | Method for measuring film thickness of metal film or amount of inclusion of each element in metal film |
| JPS58219403A (en) * | 1982-06-16 | 1983-12-20 | Aloka Co Ltd | Method for measuring thickness of laminated films |
| JPH0210144A (en) * | 1988-06-28 | 1990-01-12 | Kawasaki Steel Corp | Method for measuring simultaneously thickness and composition of film |
| US7356114B2 (en) | 2005-09-14 | 2008-04-08 | Rigaku Industrial Corporation | X-ray fluorescence spectrometer |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52109991A (en) * | 1976-03-12 | 1977-09-14 | Nisshin Steel Co Ltd | Measuring method for alloyed degree by means of fluorescent x-rays and measuring apparatus therefor |
-
1978
- 1978-08-11 JP JP9851378A patent/JPS5524680A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52109991A (en) * | 1976-03-12 | 1977-09-14 | Nisshin Steel Co Ltd | Measuring method for alloyed degree by means of fluorescent x-rays and measuring apparatus therefor |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5850412A (en) * | 1981-09-22 | 1983-03-24 | Rigaku Denki Kogyo Kk | Method for measuring film thickness of metal film or amount of inclusion of each element in metal film |
| JPH0211844B2 (en) * | 1981-09-22 | 1990-03-16 | Rigaku Denki Kogyo Kk | |
| JPS58219403A (en) * | 1982-06-16 | 1983-12-20 | Aloka Co Ltd | Method for measuring thickness of laminated films |
| JPH0210144A (en) * | 1988-06-28 | 1990-01-12 | Kawasaki Steel Corp | Method for measuring simultaneously thickness and composition of film |
| JPH0739987B2 (en) * | 1988-06-28 | 1995-05-01 | 川崎製鉄株式会社 | Simultaneous measurement of film thickness and composition |
| US7356114B2 (en) | 2005-09-14 | 2008-04-08 | Rigaku Industrial Corporation | X-ray fluorescence spectrometer |
| KR101046018B1 (en) * | 2005-09-14 | 2011-07-01 | 가부시키가이샤 리가쿠 | Fluorescence X-ray Analyzer |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6367121B2 (en) | 1988-12-23 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| ES8106404A1 (en) | Process and arrangement for examining a body by means of penetrating rays. | |
| US4129778A (en) | Method and apparatus for measuring the thickness of a non-metallic coating on a plated metal plate | |
| GB1560970A (en) | On-line system for monitoring sheet material additives | |
| JPS5524680A (en) | Measurement of thickness of metal coating and component of another metal in the coating film | |
| US20190346380A1 (en) | Afterglow detection device and afterglow detection method | |
| CA1160364A (en) | Device for determining the proportions by volume of a multiple-component mixture by irradiation with several gamma lines | |
| US4182954A (en) | Method and apparatus for measuring material properties related to radiation attenuation | |
| US3046402A (en) | Multiple thickness times density gamma gauge | |
| JPH0211844B2 (en) | ||
| EP0206735A2 (en) | Coating weight and thickness gauges | |
| JPH01134291A (en) | Scintillation type dose rate meter | |
| JPS57197410A (en) | Measuring method of adhered amount of high polymer film on metallic plate | |
| JPS5582006A (en) | Measuring method for thickness | |
| JPS6385309A (en) | Method and apparatus for measuring thickness of liquid film on plate-like material | |
| DE69017228T2 (en) | METHOD AND DEVICE FOR DISTANCE MEASUREMENT. | |
| GB1291647A (en) | Apparatus for determining blood-flow in a living animal | |
| Mayer et al. | A scintillation counter technique for the X-ray determination of bone mineral content | |
| GB872464A (en) | Apparatus for measuring the thickness of a coating on a base material | |
| JPS61259151A (en) | X-ray analyser | |
| JPS54123987A (en) | Radiation detector | |
| JPS60113173A (en) | Background subtracting method of pollutive radiation dode measuring device | |
| JPS58219403A (en) | Method for measuring thickness of laminated films | |
| US3716715A (en) | Thickness measurements using the mossbauer effect | |
| JPS55114903A (en) | Radiation thickness gauge | |
| JPS5450359A (en) | Radiation thickness gauge |