JPS5450359A - Radiation thickness gauge - Google Patents
Radiation thickness gaugeInfo
- Publication number
- JPS5450359A JPS5450359A JP11701977A JP11701977A JPS5450359A JP S5450359 A JPS5450359 A JP S5450359A JP 11701977 A JP11701977 A JP 11701977A JP 11701977 A JP11701977 A JP 11701977A JP S5450359 A JPS5450359 A JP S5450359A
- Authority
- JP
- Japan
- Prior art keywords
- thickness
- temperature
- signals
- radiation
- counting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE: To accomplish the temperature compensation in real time by providing a counting circuit for counting the thickness signals generated from a detector and a thermometer for measuring the temperature in a position substantially equal to a thickness measuring position of an object.
CONSTITUTION: A radiation thickness gauge is equipped with a radiation thermometer 11, which is inclined to measure the temperature at a position equal to a thickness measuring position 12. The detected temperature is introduced into an amplifier 13 and a linearizer 13 so that it is converted into temperature signals. These signals are converted into a frequency by a V-F converter 14 and then counted by a counter 15 for counting with the same timing as a thickness signal counter 8. The integrated values of the counters 8 and 15 are fed to a compensating circuit 17, which is further supplied with density signals so that they may be subjected to compensating operation. If the density signals of a plate 5 to be measured are preset from the outside, the radiation thickness gausge can measure the thickness T of the plate 5
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11701977A JPS5450359A (en) | 1977-09-29 | 1977-09-29 | Radiation thickness gauge |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11701977A JPS5450359A (en) | 1977-09-29 | 1977-09-29 | Radiation thickness gauge |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5450359A true JPS5450359A (en) | 1979-04-20 |
Family
ID=14701423
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11701977A Pending JPS5450359A (en) | 1977-09-29 | 1977-09-29 | Radiation thickness gauge |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5450359A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6053806A (en) * | 1983-09-02 | 1985-03-27 | Sumitomo Metal Ind Ltd | Thickness measuring method |
| JPS61223507A (en) * | 1985-03-29 | 1986-10-04 | Fuji Electric Co Ltd | Radiation transmitting thickness meter for controlling rolling |
| JPS63111407A (en) * | 1986-10-29 | 1988-05-16 | Nippon Steel Corp | Profile measuring instrument |
| USRE38807E1 (en) * | 1997-11-18 | 2005-10-04 | Matsushita Electric Industrial Co., Ltd. | High pressure discharge lamp, with tungsten electrode and lighting optical apparatus and image display system using the same |
| US11229423B2 (en) | 2016-04-27 | 2022-01-25 | nano grains Co., Ltd. | Tissue collecting instrument |
-
1977
- 1977-09-29 JP JP11701977A patent/JPS5450359A/en active Pending
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6053806A (en) * | 1983-09-02 | 1985-03-27 | Sumitomo Metal Ind Ltd | Thickness measuring method |
| JPH0242411B2 (en) * | 1983-09-02 | 1990-09-21 | ||
| JPS61223507A (en) * | 1985-03-29 | 1986-10-04 | Fuji Electric Co Ltd | Radiation transmitting thickness meter for controlling rolling |
| JPH0443207B2 (en) * | 1985-03-29 | 1992-07-15 | Fuji Denki Kk | |
| JPS63111407A (en) * | 1986-10-29 | 1988-05-16 | Nippon Steel Corp | Profile measuring instrument |
| USRE38807E1 (en) * | 1997-11-18 | 2005-10-04 | Matsushita Electric Industrial Co., Ltd. | High pressure discharge lamp, with tungsten electrode and lighting optical apparatus and image display system using the same |
| US11229423B2 (en) | 2016-04-27 | 2022-01-25 | nano grains Co., Ltd. | Tissue collecting instrument |
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