JPS55142204A - Calculation processing method for thickness gauge - Google Patents

Calculation processing method for thickness gauge

Info

Publication number
JPS55142204A
JPS55142204A JP5035579A JP5035579A JPS55142204A JP S55142204 A JPS55142204 A JP S55142204A JP 5035579 A JP5035579 A JP 5035579A JP 5035579 A JP5035579 A JP 5035579A JP S55142204 A JPS55142204 A JP S55142204A
Authority
JP
Japan
Prior art keywords
thickness
signal
plate
radiation
calculation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5035579A
Other languages
Japanese (ja)
Inventor
Shoichi Horiuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP5035579A priority Critical patent/JPS55142204A/en
Publication of JPS55142204A publication Critical patent/JPS55142204A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE: To simplify calculation and improve response in measuring the thickness of a plate through absorption of radiation, by previously making a table of real counting rates for the thickness of the plate and determining the plate thickness through rectilinear interpolation between two real counting rates nearest to measured ones.
CONSTITUTION: A shielding container 2, in which a radiation source is housed, and a detector 3 employing a photoelectric multiplier or the like are provided at both the sides of a measured piece 1 such as a steel plate. The output pulses of a detector 3 based on radiation transmitted through the measured piece are changed into a calculable signal by a signal converter 7. The signal is applied to a calculation processor 8. The pulse signal and a temperature signal, which is detected by a temperature detector 4 and applied to the processor 8 through the signal converter 7, are calculated and processed to be indicated on a display recorder 9. A table of counting rates, which is previously made, is used for the counting part of the characteristic curve of a transmitted radiation output corresponding to the thickness of the measured piece 1. The thickness is determined by rectilinear interpolation. According to this method, calculation is simplified and response is improved.
COPYRIGHT: (C)1980,JPO&Japio
JP5035579A 1979-04-25 1979-04-25 Calculation processing method for thickness gauge Pending JPS55142204A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5035579A JPS55142204A (en) 1979-04-25 1979-04-25 Calculation processing method for thickness gauge

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5035579A JPS55142204A (en) 1979-04-25 1979-04-25 Calculation processing method for thickness gauge

Publications (1)

Publication Number Publication Date
JPS55142204A true JPS55142204A (en) 1980-11-06

Family

ID=12856583

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5035579A Pending JPS55142204A (en) 1979-04-25 1979-04-25 Calculation processing method for thickness gauge

Country Status (1)

Country Link
JP (1) JPS55142204A (en)

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