JPS55142204A - Calculation processing method for thickness gauge - Google Patents
Calculation processing method for thickness gaugeInfo
- Publication number
- JPS55142204A JPS55142204A JP5035579A JP5035579A JPS55142204A JP S55142204 A JPS55142204 A JP S55142204A JP 5035579 A JP5035579 A JP 5035579A JP 5035579 A JP5035579 A JP 5035579A JP S55142204 A JPS55142204 A JP S55142204A
- Authority
- JP
- Japan
- Prior art keywords
- thickness
- signal
- plate
- radiation
- calculation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE: To simplify calculation and improve response in measuring the thickness of a plate through absorption of radiation, by previously making a table of real counting rates for the thickness of the plate and determining the plate thickness through rectilinear interpolation between two real counting rates nearest to measured ones.
CONSTITUTION: A shielding container 2, in which a radiation source is housed, and a detector 3 employing a photoelectric multiplier or the like are provided at both the sides of a measured piece 1 such as a steel plate. The output pulses of a detector 3 based on radiation transmitted through the measured piece are changed into a calculable signal by a signal converter 7. The signal is applied to a calculation processor 8. The pulse signal and a temperature signal, which is detected by a temperature detector 4 and applied to the processor 8 through the signal converter 7, are calculated and processed to be indicated on a display recorder 9. A table of counting rates, which is previously made, is used for the counting part of the characteristic curve of a transmitted radiation output corresponding to the thickness of the measured piece 1. The thickness is determined by rectilinear interpolation. According to this method, calculation is simplified and response is improved.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5035579A JPS55142204A (en) | 1979-04-25 | 1979-04-25 | Calculation processing method for thickness gauge |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5035579A JPS55142204A (en) | 1979-04-25 | 1979-04-25 | Calculation processing method for thickness gauge |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55142204A true JPS55142204A (en) | 1980-11-06 |
Family
ID=12856583
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5035579A Pending JPS55142204A (en) | 1979-04-25 | 1979-04-25 | Calculation processing method for thickness gauge |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55142204A (en) |
-
1979
- 1979-04-25 JP JP5035579A patent/JPS55142204A/en active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS56153212A (en) | Encoder | |
ES480472A1 (en) | Device for determining the spatial absorption distribution in a plane of examination | |
DE3279479D1 (en) | Apparatus for measuring thickness | |
JPS5332789A (en) | Method and apparatus for measuring of stress of white color x-ray | |
JPS55142204A (en) | Calculation processing method for thickness gauge | |
JPS5342762A (en) | Radiation measuring apparatus | |
JPS5425779A (en) | Torque measuring method of electric dynamometers | |
JPS5450359A (en) | Radiation thickness gauge | |
JPS5442180A (en) | Field intensity measuring apparatus | |
JPS5428669A (en) | Noise measuring circuit | |
JPS5499664A (en) | Plate thickness measuring apparatus | |
JPS5359456A (en) | Correction method of working curve in radiation glavanizing thicknessmeasuring apparatus | |
JPS5567605A (en) | Thickness measuring method by ultrasonic wave | |
JPS5411785A (en) | Radiation measuring apparatus | |
JPS53108488A (en) | Flaw detector for tubes | |
JPS5441783A (en) | Method and apparatus for detection of ultrasonic wave receiving signals | |
JPS53148400A (en) | Radiant ray detector of semiconductor | |
JPS5596403A (en) | Distance detector | |
JPS55164353A (en) | Hardening characteristic measuring unit by acoustic measurement | |
JPS5572808A (en) | Measuring method of radiation thickness gauge | |
JPS5788370A (en) | Measuring device for radiant ray | |
JPS5420761A (en) | Pipe wall thickness gauge | |
JPS55132966A (en) | Radiation telescope | |
JPS5391772A (en) | Measurement apparatus | |
JPS5376888A (en) | Concentration measuring apparatus |