JPS5467458A - Mutual interference compensator for thickness meter - Google Patents

Mutual interference compensator for thickness meter

Info

Publication number
JPS5467458A
JPS5467458A JP13350977A JP13350977A JPS5467458A JP S5467458 A JPS5467458 A JP S5467458A JP 13350977 A JP13350977 A JP 13350977A JP 13350977 A JP13350977 A JP 13350977A JP S5467458 A JPS5467458 A JP S5467458A
Authority
JP
Japan
Prior art keywords
thickness
meter
signals
metered
mutual interference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13350977A
Other languages
Japanese (ja)
Other versions
JPS576522B2 (en
Inventor
Shoichi Horiuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP13350977A priority Critical patent/JPS5467458A/en
Publication of JPS5467458A publication Critical patent/JPS5467458A/en
Publication of JPS576522B2 publication Critical patent/JPS576522B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE: To eliminate the error due to mutual interferences by generating the positional signals of the respective detecting portions of thickness meters at position detecting portions, by calculating the spacing between the detectors with the use of a distance meter and by compensating the metered signals with the use of the output as well as the preset compensation value of the mutual interference.
CONSTITUTION: The center thickness of a test piece 1 and the thickness of a plate end are metered and generated as metering signals by means of a first thickness meter 2a, a detector 4a, a beam souce container 5a, and a second thickness meter 2b, a detector 4b, and a beam souce container 5b. There are provided position detectors 7a and 7b, which are operative to detect the respective positions of the detecting portions of the first and second thickness meters 2a and 2b, and the positional signals therefrom are fed to a distance meter 8 so that the spacing inbetween is metered. The output of this meter 8 is fed to a compensation calculating device 10, which is supplied with the metered signals from the detectors through data taking devices 9a and 9b. The device 10 is stored with the preset compensated value of the mutual interference, and the metered signals from the detecting portions are compensated in accordance with the output from the meter 8 so that the error in the mutual interference may be compensated.
COPYRIGHT: (C)1979,JPO&Japio
JP13350977A 1977-11-09 1977-11-09 Mutual interference compensator for thickness meter Granted JPS5467458A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13350977A JPS5467458A (en) 1977-11-09 1977-11-09 Mutual interference compensator for thickness meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13350977A JPS5467458A (en) 1977-11-09 1977-11-09 Mutual interference compensator for thickness meter

Publications (2)

Publication Number Publication Date
JPS5467458A true JPS5467458A (en) 1979-05-30
JPS576522B2 JPS576522B2 (en) 1982-02-05

Family

ID=15106430

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13350977A Granted JPS5467458A (en) 1977-11-09 1977-11-09 Mutual interference compensator for thickness meter

Country Status (1)

Country Link
JP (1) JPS5467458A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5810604A (en) * 1981-07-13 1983-01-21 Toshiba Corp Plate thickness measuring apparatus

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58211429A (en) * 1982-06-01 1983-12-08 Daifuku Co Ltd Resin board-like body and molding method thereof
JPS6316114U (en) * 1986-07-17 1988-02-02

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5810604A (en) * 1981-07-13 1983-01-21 Toshiba Corp Plate thickness measuring apparatus
JPH0158444B2 (en) * 1981-07-13 1989-12-12 Toshiba Kk

Also Published As

Publication number Publication date
JPS576522B2 (en) 1982-02-05

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