JPS55115345A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS55115345A
JPS55115345A JP2293079A JP2293079A JPS55115345A JP S55115345 A JPS55115345 A JP S55115345A JP 2293079 A JP2293079 A JP 2293079A JP 2293079 A JP2293079 A JP 2293079A JP S55115345 A JPS55115345 A JP S55115345A
Authority
JP
Japan
Prior art keywords
nitride film
wafer
groove
oxide film
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2293079A
Other languages
Japanese (ja)
Inventor
Hiroo Sasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CHIYOU LSI GIJUTSU KENKYU KUMIAI
Original Assignee
CHIYOU LSI GIJUTSU KENKYU KUMIAI
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CHIYOU LSI GIJUTSU KENKYU KUMIAI filed Critical CHIYOU LSI GIJUTSU KENKYU KUMIAI
Priority to JP2293079A priority Critical patent/JPS55115345A/en
Publication of JPS55115345A publication Critical patent/JPS55115345A/en
Pending legal-status Critical Current

Links

Landscapes

  • Local Oxidation Of Silicon (AREA)
  • Drying Of Semiconductors (AREA)

Abstract

PURPOSE: To obtain an oxide film for isolating the elements, which has high precision with no swell on the surface of wafer and no encroachment in the lateral direction, by laminating a nitride film on the wafer.
CONSTITUTION: The mask 2 of nitride film is provided on the Si wafer 1 and oxidized at high tempeature, the oxide film is etched with fluoric acid to form the groove 5. The nitride film 6 is generated by the vapor growth method to cover the entire surface. Next the nitride film 6 is removed from the bottom of the groove 5 by the plasma of Freon gas. At this time, the nitride film 7 is remained under the eaves of the nitride film 2 in the groove 5 on account of the rectilinear propagation nature of gas plasma. The oxide film 8 is generated up to the surface of wafer by wet oxidation, and the nitride film 2 is removed from the surface last. In this way, a flat surface can be obtained, no break of the wiring will take place, the dimension of isolating layer is exact, no deterioration of voltage withstanding capability will be developed, the device can be miniaturized.
COPYRIGHT: (C)1980,JPO&Japio
JP2293079A 1979-02-28 1979-02-28 Manufacture of semiconductor device Pending JPS55115345A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2293079A JPS55115345A (en) 1979-02-28 1979-02-28 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2293079A JPS55115345A (en) 1979-02-28 1979-02-28 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS55115345A true JPS55115345A (en) 1980-09-05

Family

ID=12096340

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2293079A Pending JPS55115345A (en) 1979-02-28 1979-02-28 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS55115345A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57180152A (en) * 1981-04-30 1982-11-06 Oki Electric Ind Co Ltd Manufacture of semiconductor device
JPS58135655A (en) * 1982-02-08 1983-08-12 Nippon Telegr & Teleph Corp <Ntt> Manufacture of semiconductor device with oxide film

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53120289A (en) * 1977-03-30 1978-10-20 Toshiba Corp Manufacture of semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53120289A (en) * 1977-03-30 1978-10-20 Toshiba Corp Manufacture of semiconductor device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57180152A (en) * 1981-04-30 1982-11-06 Oki Electric Ind Co Ltd Manufacture of semiconductor device
JPS58135655A (en) * 1982-02-08 1983-08-12 Nippon Telegr & Teleph Corp <Ntt> Manufacture of semiconductor device with oxide film
JPH0413854B2 (en) * 1982-02-08 1992-03-11 Nippon Telegraph & Telephone

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