JPS5480039A - Holding time test method for semiconductor - Google Patents

Holding time test method for semiconductor

Info

Publication number
JPS5480039A
JPS5480039A JP14786877A JP14786877A JPS5480039A JP S5480039 A JPS5480039 A JP S5480039A JP 14786877 A JP14786877 A JP 14786877A JP 14786877 A JP14786877 A JP 14786877A JP S5480039 A JPS5480039 A JP S5480039A
Authority
JP
Japan
Prior art keywords
test
light
time
shutter
irradiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14786877A
Other languages
English (en)
Japanese (ja)
Other versions
JPS63880B2 (enExample
Inventor
Michio Honma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP14786877A priority Critical patent/JPS5480039A/ja
Publication of JPS5480039A publication Critical patent/JPS5480039A/ja
Publication of JPS63880B2 publication Critical patent/JPS63880B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP14786877A 1977-12-08 1977-12-08 Holding time test method for semiconductor Granted JPS5480039A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14786877A JPS5480039A (en) 1977-12-08 1977-12-08 Holding time test method for semiconductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14786877A JPS5480039A (en) 1977-12-08 1977-12-08 Holding time test method for semiconductor

Publications (2)

Publication Number Publication Date
JPS5480039A true JPS5480039A (en) 1979-06-26
JPS63880B2 JPS63880B2 (enExample) 1988-01-08

Family

ID=15440046

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14786877A Granted JPS5480039A (en) 1977-12-08 1977-12-08 Holding time test method for semiconductor

Country Status (1)

Country Link
JP (1) JPS5480039A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0541426A (ja) * 1991-12-02 1993-02-19 Tokyo Electron Ltd Ｅｐｒｏｍ用ウエハプローバおよびメモリチツプのリダンダンシー用ウエハプローバ

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0541426A (ja) * 1991-12-02 1993-02-19 Tokyo Electron Ltd Ｅｐｒｏｍ用ウエハプローバおよびメモリチツプのリダンダンシー用ウエハプローバ

Also Published As

Publication number Publication date
JPS63880B2 (enExample) 1988-01-08

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