JPS54146583A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS54146583A
JPS54146583A JP5513978A JP5513978A JPS54146583A JP S54146583 A JPS54146583 A JP S54146583A JP 5513978 A JP5513978 A JP 5513978A JP 5513978 A JP5513978 A JP 5513978A JP S54146583 A JPS54146583 A JP S54146583A
Authority
JP
Japan
Prior art keywords
layer
buried
gate
epitaxial
buried layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5513978A
Other languages
Japanese (ja)
Inventor
Masao Yoshizawa
Hiroshi Sugano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP5513978A priority Critical patent/JPS54146583A/en
Publication of JPS54146583A publication Critical patent/JPS54146583A/en
Pending legal-status Critical Current

Links

Landscapes

  • Junction Field-Effect Transistors (AREA)

Abstract

PURPOSE: To obtain a J-FET featuring the stable characteristics in an easy way by providing the p- buried layer on the n+ buried layer on the p-type substrate to form the p-channel, using the n+ buried layer for the 1st gate layer and using the epitaxial layer on the p- buried layer or the N+ layer on the surface of the epitaxial layer for the 2nd gate layer respectively.
CONSTITUTION: The n+ buried layer 103 is formed on the p-type substrate through the ion injection. Then the ion is injected again selectively to form p- buried layer 104 and p-buried isolation layer 105, and n-epitaxial layer 102 is formed. Then p+ source layer 107, drain layer 108 and isolation layer 106 are formed selectively, and then ohmic contact n+ layer 110 is formed selectively for p+ source layer 107 for the 2nd gate and 1st gate layer 103. The opening is drilled to the insulator film on layers 107∼110 with the electrde attached. In such constitution, the p-channel can feature the p- or p type, and the auto-doping is reduced at the epitaxial growing time with facilitated control of the specific resistance. Furthermore, no inversion is caused to n-layer 102 at the border between layer 102 and substrate 101. Thus, the high-accuracy and high-quality p- buried layer can be formed in a stable way, ensuring a highly uniform control for the FET characteristics.
COPYRIGHT: (C)1979,JPO&Japio
JP5513978A 1978-05-09 1978-05-09 Semiconductor device Pending JPS54146583A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5513978A JPS54146583A (en) 1978-05-09 1978-05-09 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5513978A JPS54146583A (en) 1978-05-09 1978-05-09 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS54146583A true JPS54146583A (en) 1979-11-15

Family

ID=12990437

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5513978A Pending JPS54146583A (en) 1978-05-09 1978-05-09 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS54146583A (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49114882A (en) * 1973-02-28 1974-11-01
JPS5261970A (en) * 1975-11-18 1977-05-21 Mitsubishi Electric Corp Production of semiconductor device
JPS5279784A (en) * 1975-12-26 1977-07-05 Sony Corp Semiconductor device
JPS52103976A (en) * 1976-02-26 1977-08-31 Sony Corp Semiconductor integrated circuit
JPS5339880A (en) * 1976-09-24 1978-04-12 Hitachi Ltd Field effect type semiconductor device and its production

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49114882A (en) * 1973-02-28 1974-11-01
JPS5261970A (en) * 1975-11-18 1977-05-21 Mitsubishi Electric Corp Production of semiconductor device
JPS5279784A (en) * 1975-12-26 1977-07-05 Sony Corp Semiconductor device
JPS52103976A (en) * 1976-02-26 1977-08-31 Sony Corp Semiconductor integrated circuit
JPS5339880A (en) * 1976-09-24 1978-04-12 Hitachi Ltd Field effect type semiconductor device and its production

Similar Documents

Publication Publication Date Title
JPS6450554A (en) Manufacture of complementary semiconductor device
JPS5727070A (en) Mos type semiconductor device
JPS645070A (en) Vertical insulated gate field effect transistor
JPS54146583A (en) Semiconductor device
JPS55111171A (en) Field-effect semiconductor device
JPS5499578A (en) Field effect transistor
JPS5381087A (en) Gallium aresenide field effect transistor
JPS54109761A (en) Manufacture of semiconductor device
JPS6431471A (en) Semiconductor device
JPS57121271A (en) Field effect transistor
JPS5649575A (en) Junction type field effect semiconductor
JPS5574181A (en) Preparing junction type field effect transistor
JPS6410671A (en) Compound semiconductor field effect transistor
JPS5286086A (en) Field effect transistor
JPS572579A (en) Manufacture of junction type field effect transistor
JPS55141760A (en) Field effect transistor
JPS55105376A (en) Manufacture process of semiconductor device
JPS57112075A (en) Insulating gate fet
JPS56108275A (en) Field effect transistor
JPS5541747A (en) Field effect transistor
JPS56115572A (en) Field effect transistor
JPS54149478A (en) Junction type field effect semiconductor device
JPS57128073A (en) Semiconductor integrated circuit device
JPS5390878A (en) Manufacture of schottky barrier gate field effect transistor
JPS57199268A (en) Junction type field effect transistor