JPS5371577A - Nonvalatile semiconductor memory device - Google Patents
Nonvalatile semiconductor memory deviceInfo
- Publication number
- JPS5371577A JPS5371577A JP14803576A JP14803576A JPS5371577A JP S5371577 A JPS5371577 A JP S5371577A JP 14803576 A JP14803576 A JP 14803576A JP 14803576 A JP14803576 A JP 14803576A JP S5371577 A JPS5371577 A JP S5371577A
- Authority
- JP
- Japan
- Prior art keywords
- nonvalatile
- memory device
- semiconductor memory
- region
- junction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title 1
- 239000012535 impurity Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/788—Field effect transistors with field effect produced by an insulated gate with floating gate
- H01L29/7881—Programmable transistors with only two possible levels of programmation
Abstract
PURPOSE:The high impurity density region of the same conduction type as the substrate is provided in contact with the drain, and on the region except the region which becomes a substantial channel between it and the drain, write low dielectric-strength PN junction is formed; and further, a floating gate electrode is made to expand onto the write PN junction, thereby making the length of the channel short.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14803576A JPS5371577A (en) | 1976-12-08 | 1976-12-08 | Nonvalatile semiconductor memory device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14803576A JPS5371577A (en) | 1976-12-08 | 1976-12-08 | Nonvalatile semiconductor memory device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5371577A true JPS5371577A (en) | 1978-06-26 |
Family
ID=15443650
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14803576A Pending JPS5371577A (en) | 1976-12-08 | 1976-12-08 | Nonvalatile semiconductor memory device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5371577A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57117279A (en) * | 1981-01-13 | 1982-07-21 | Nec Corp | Non volatile semiconductor memory unit |
-
1976
- 1976-12-08 JP JP14803576A patent/JPS5371577A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57117279A (en) * | 1981-01-13 | 1982-07-21 | Nec Corp | Non volatile semiconductor memory unit |
JPH0127598B2 (en) * | 1981-01-13 | 1989-05-30 | Nippon Electric Co |
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