JPS52156552A - Wafer inspection apparatus - Google Patents

Wafer inspection apparatus

Info

Publication number
JPS52156552A
JPS52156552A JP7318176A JP7318176A JPS52156552A JP S52156552 A JPS52156552 A JP S52156552A JP 7318176 A JP7318176 A JP 7318176A JP 7318176 A JP7318176 A JP 7318176A JP S52156552 A JPS52156552 A JP S52156552A
Authority
JP
Japan
Prior art keywords
wafer inspection
inspection apparatus
sheet
workability
unloading
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7318176A
Other languages
Japanese (ja)
Other versions
JPS6118337B2 (en
Inventor
Hiroshi Nashihara
Hiroshi Maejima
Tetsuya Takagaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP7318176A priority Critical patent/JPS52156552A/en
Publication of JPS52156552A publication Critical patent/JPS52156552A/en
Publication of JPS6118337B2 publication Critical patent/JPS6118337B2/ja
Granted legal-status Critical Current

Links

Abstract

PURPOSE: To improve the workability of wafer inspection by automatically performing loading and unloading of semiconductor wafers sheet by sheet.
COPYRIGHT: (C)1977,JPO&Japio
JP7318176A 1976-06-23 1976-06-23 Wafer inspection apparatus Granted JPS52156552A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7318176A JPS52156552A (en) 1976-06-23 1976-06-23 Wafer inspection apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7318176A JPS52156552A (en) 1976-06-23 1976-06-23 Wafer inspection apparatus

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP856784A Division JPS59139642A (en) 1984-01-23 1984-01-23 Inspecting device for wafer

Publications (2)

Publication Number Publication Date
JPS52156552A true JPS52156552A (en) 1977-12-27
JPS6118337B2 JPS6118337B2 (en) 1986-05-12

Family

ID=13510703

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7318176A Granted JPS52156552A (en) 1976-06-23 1976-06-23 Wafer inspection apparatus

Country Status (1)

Country Link
JP (1) JPS52156552A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5757104A (en) * 1980-09-24 1982-04-06 Hitachi Ltd Plate-shaped work automatic feeding holding equipment
JPS59188652A (en) * 1983-02-28 1984-10-26 タマラツク・サイエンテイフイツク・カンパニ−・インコ−ポレ−テツド Automatic system for exposing and processing double side printed circuit panel
JPS62133546U (en) * 1986-02-17 1987-08-22

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5757104A (en) * 1980-09-24 1982-04-06 Hitachi Ltd Plate-shaped work automatic feeding holding equipment
JPS59188652A (en) * 1983-02-28 1984-10-26 タマラツク・サイエンテイフイツク・カンパニ−・インコ−ポレ−テツド Automatic system for exposing and processing double side printed circuit panel
JPS62133546U (en) * 1986-02-17 1987-08-22
JPH0423858Y2 (en) * 1986-02-17 1992-06-04

Also Published As

Publication number Publication date
JPS6118337B2 (en) 1986-05-12

Similar Documents

Publication Publication Date Title
JPS5212576A (en) Wafer washing drying device
JPS5210069A (en) Automatic apparatus for cleaning and drying wafer
JPS5318967A (en) Wafer sucking jig
JPS52156552A (en) Wafer inspection apparatus
JPS52125269A (en) Removing device for projecting defects from wafer
JPS5439576A (en) Inspection method for semiconductor device
JPS5210032A (en) Construction method of semiconductor memory unit
JPS5242365A (en) Tool for semiconductors
JPS5228274A (en) Containing method of wafer to magazine
JPS5240075A (en) Wafer prober
JPS5413272A (en) Measuring unit for semiconductor
JPS51140638A (en) Positioning method
JPS5424575A (en) Handling method of wafer
JPS5242366A (en) Method of preventing occurence of crystal defects of silicon wafers
JPS52144960A (en) Inspecting method of semiconductor wafers
JPS5365070A (en) Wafer prober
JPS52150974A (en) Semiconductor wafer treatment apparatus
JPS53142168A (en) Reproductive use of semiconductor substrate
JPS51132778A (en) Inspection method of semiconductor apparatus
JPS52146558A (en) Production of beam lead type semiconductor device
JPS51137382A (en) Measuring method for junction point within semi conductor wafer
JPS51117887A (en) Semiconductor ic device
JPS5339872A (en) Etching method of wafers
JPS51132762A (en) Heat-treatment method of semiconductor device
JPS52136575A (en) Mask exposure method of semiconductor wafers