JPH1135394A - 強誘電体薄膜の製造方法および有機金属化学気相成長用原料 - Google Patents
強誘電体薄膜の製造方法および有機金属化学気相成長用原料Info
- Publication number
- JPH1135394A JPH1135394A JP9192229A JP19222997A JPH1135394A JP H1135394 A JPH1135394 A JP H1135394A JP 9192229 A JP9192229 A JP 9192229A JP 19222997 A JP19222997 A JP 19222997A JP H1135394 A JPH1135394 A JP H1135394A
- Authority
- JP
- Japan
- Prior art keywords
- dpm
- ipr
- moles
- thin film
- tetraglyme
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010409 thin film Substances 0.000 title claims abstract description 36
- 229910052751 metal Inorganic materials 0.000 title claims abstract description 30
- 239000002184 metal Substances 0.000 title claims abstract description 30
- 239000002994 raw material Substances 0.000 title claims abstract description 13
- 239000000126 substance Substances 0.000 title claims abstract 5
- 238000004519 manufacturing process Methods 0.000 title claims description 19
- ZUHZGEOKBKGPSW-UHFFFAOYSA-N tetraglyme Chemical compound COCCOCCOCCOCCOC ZUHZGEOKBKGPSW-UHFFFAOYSA-N 0.000 claims abstract description 32
- 238000000034 method Methods 0.000 claims abstract description 24
- 230000001590 oxidative effect Effects 0.000 claims abstract description 6
- 239000010408 film Substances 0.000 claims description 39
- 239000011259 mixed solution Substances 0.000 claims description 27
- 239000003960 organic solvent Substances 0.000 claims description 19
- 238000006243 chemical reaction Methods 0.000 claims description 17
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 claims description 16
- 238000005229 chemical vapour deposition Methods 0.000 claims description 13
- 239000000758 substrate Substances 0.000 claims description 10
- 239000006200 vaporizer Substances 0.000 claims description 10
- 229910052758 niobium Inorganic materials 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 6
- 230000008016 vaporization Effects 0.000 claims description 5
- 238000010438 heat treatment Methods 0.000 claims description 3
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 claims description 3
- 238000001704 evaporation Methods 0.000 claims description 2
- 125000002524 organometallic group Chemical group 0.000 claims description 2
- 238000001947 vapour-phase growth Methods 0.000 claims 1
- 239000000203 mixture Substances 0.000 abstract description 29
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 abstract description 28
- 150000002739 metals Chemical class 0.000 abstract description 10
- 239000002904 solvent Substances 0.000 abstract description 7
- 239000007789 gas Substances 0.000 description 33
- 239000000243 solution Substances 0.000 description 7
- 239000003990 capacitor Substances 0.000 description 6
- 239000012159 carrier gas Substances 0.000 description 6
- 239000007788 liquid Substances 0.000 description 6
- 229910052760 oxygen Inorganic materials 0.000 description 6
- 230000010287 polarization Effects 0.000 description 6
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 5
- 239000001301 oxygen Substances 0.000 description 5
- 229910052712 strontium Inorganic materials 0.000 description 5
- 229910052715 tantalum Inorganic materials 0.000 description 5
- 238000004544 sputter deposition Methods 0.000 description 4
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 3
- 229910001882 dioxygen Inorganic materials 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 229910052797 bismuth Inorganic materials 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 239000007772 electrode material Substances 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
- H01L21/28556—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table by chemical means, e.g. CVD, LPCVD, PECVD, laser CVD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Semiconductor Memories (AREA)
- Formation Of Insulating Films (AREA)
- Chemical Vapour Deposition (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Semiconductor Integrated Circuits (AREA)
- Inorganic Insulating Materials (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9192229A JPH1135394A (ja) | 1997-07-17 | 1997-07-17 | 強誘電体薄膜の製造方法および有機金属化学気相成長用原料 |
KR1019980028888A KR100497926B1 (ko) | 1997-07-17 | 1998-07-16 | 강유전성박막의제조방법및유기금속화학기상증착용원료 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9192229A JPH1135394A (ja) | 1997-07-17 | 1997-07-17 | 強誘電体薄膜の製造方法および有機金属化学気相成長用原料 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH1135394A true JPH1135394A (ja) | 1999-02-09 |
Family
ID=16287820
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9192229A Pending JPH1135394A (ja) | 1997-07-17 | 1997-07-17 | 強誘電体薄膜の製造方法および有機金属化学気相成長用原料 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPH1135394A (ko) |
KR (1) | KR100497926B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2370271A (en) * | 2000-05-06 | 2002-06-26 | Inorgtech Ltd | Novel precursors for the growth of heterometal oxide films by MOCVD |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100381498B1 (ko) * | 1995-05-22 | 2005-02-05 | 미쓰비시 마테리알 가부시키가이샤 | 비스무스계유전체박막및그의형성방법및그박막형성용조성물 |
JP3137004B2 (ja) * | 1995-09-11 | 2001-02-19 | ソニー株式会社 | 半導体素子のキャパシタ構造の作製方法 |
JP3223772B2 (ja) * | 1995-11-15 | 2001-10-29 | 三菱マテリアル株式会社 | Bi系強誘電体薄膜形成用組成物、薄膜形成方法及びBi系強誘電体薄膜 |
-
1997
- 1997-07-17 JP JP9192229A patent/JPH1135394A/ja active Pending
-
1998
- 1998-07-16 KR KR1019980028888A patent/KR100497926B1/ko not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2370271A (en) * | 2000-05-06 | 2002-06-26 | Inorgtech Ltd | Novel precursors for the growth of heterometal oxide films by MOCVD |
GB2370271B (en) * | 2000-05-06 | 2004-02-11 | Inorgtech Ltd | Novel precursors for the growth of heterometal oxide films by mocvd |
Also Published As
Publication number | Publication date |
---|---|
KR100497926B1 (ko) | 2006-05-25 |
KR19990013958A (ko) | 1999-02-25 |
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