JPH1126735A - 結合soiウェハ - Google Patents
結合soiウェハInfo
- Publication number
- JPH1126735A JPH1126735A JP19505497A JP19505497A JPH1126735A JP H1126735 A JPH1126735 A JP H1126735A JP 19505497 A JP19505497 A JP 19505497A JP 19505497 A JP19505497 A JP 19505497A JP H1126735 A JPH1126735 A JP H1126735A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- thin film
- active layer
- hole
- bonded
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/322—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to modify their internal properties, e.g. to produce internal imperfections
- H01L21/3221—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to modify their internal properties, e.g. to produce internal imperfections of silicon bodies, e.g. for gettering
- H01L21/3226—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to modify their internal properties, e.g. to produce internal imperfections of silicon bodies, e.g. for gettering of silicon on insulator
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Element Separation (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19505497A JPH1126735A (ja) | 1997-07-04 | 1997-07-04 | 結合soiウェハ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19505497A JPH1126735A (ja) | 1997-07-04 | 1997-07-04 | 結合soiウェハ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH1126735A true JPH1126735A (ja) | 1999-01-29 |
| JPH1126735A5 JPH1126735A5 (enExample) | 2004-11-04 |
Family
ID=16334795
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19505497A Pending JPH1126735A (ja) | 1997-07-04 | 1997-07-04 | 結合soiウェハ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH1126735A (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2000010195A3 (en) * | 1998-08-10 | 2000-05-18 | Memc Electronic Materials | Preparation of metal-precipitates permeable insulator for soi substrate |
| JP2010062414A (ja) * | 2008-09-05 | 2010-03-18 | Sumco Corp | 裏面照射型固体撮像素子用ウェーハの製造方法 |
| US8293613B2 (en) | 2007-03-12 | 2012-10-23 | Samsung Electronics Co., Ltd. | Gettering structures and methods and their application |
-
1997
- 1997-07-04 JP JP19505497A patent/JPH1126735A/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2000010195A3 (en) * | 1998-08-10 | 2000-05-18 | Memc Electronic Materials | Preparation of metal-precipitates permeable insulator for soi substrate |
| US8293613B2 (en) | 2007-03-12 | 2012-10-23 | Samsung Electronics Co., Ltd. | Gettering structures and methods and their application |
| JP2010062414A (ja) * | 2008-09-05 | 2010-03-18 | Sumco Corp | 裏面照射型固体撮像素子用ウェーハの製造方法 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A977 | Report on retrieval |
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| A131 | Notification of reasons for refusal |
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| A521 | Written amendment |
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| A02 | Decision of refusal |
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